Presentation 2022-11-25
Growth temperature dependence of semipolar {11-22} AlInN/GaInN
Takahiro Fujisawa, Taiki Nakabayashi, Takashi Egawa, Makoto Miyoshi, Tetsuya Takeuchi, Narihito Okada, Kazuyuki Tadatomo,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) AlInN alloys are promising materials for GaN-based electronic and optical devices. In this study, AlInN layers with a thickness of about 400 nm and a high InN mole fraction were grown on fully relaxed semipolar {11-22} Ga0.9In0.1N for application to long-wavelength GaN-LDs cladding layers. and evaluated them. It was confirmed that the grown AlInN had high InN molar fractions ranging from 0.306 to 0.444 and relatively flat surfaces with an RMS of less than 1.5 nm. In addition, AlInN layers were almost relaxed, and the surfaces were flat despite the presence of basal plane layer defects (BSFs) propagated from the substrate and many different dislocations. When compared to AlInN grown on c-plane GaN, it was confirmed that AlInN layers on semipolar {11-22}Ga0.9In0.1N had higher InN mole fraction even at the same growth temperature.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) semipolar / {11-22} / MOCVD / AlInN
Paper # ED2022-42,CPM2022-67,LQE2022-75
Date of Issue 2022-11-17 (ED, CPM, LQE)

Conference Information
Committee CPM / ED / LQE
Conference Date 2022/11/24(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Winc Aichi (Aichi Industry & Labor Center)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Yuichi Nakamura(Toyohashi Univ. of Tech.) / Hiroki Fujishiro(Tokyo Univ. of Science) / Junichi Takahara(Osaka Univ.)
Vice Chair Hideki Nakazawa(Hirosaki Univ.) / Seiya Sakai(Hokkaido Univ.) / Kosuke Nishimura(KDDI Research)
Secretary Hideki Nakazawa(Ehime Univ.) / Seiya Sakai(Kitami Inst. of Tech) / Kosuke Nishimura(Saga Univ.)
Assistant Yasuo Kimura(Tokyo Univ. of Tech.) / Fumihiko Hirose(Yamagata Univ.) / Noriko Bamba(Shinshu Univ.) / Masatoshi Koyama(Osaka Inst. of Tech.) / Yoshitugu Yamamoto(Mitsubishi Electric) / Yoshiaki Nishijima(Yokohama National Univ.) / Nobuhiko Nishiyama(Tokyo Inst. of Tech.)

Paper Information
Registration To Technical Committee on Component Parts and Materials / Technical Committee on Electron Devices / Technical Committee on Lasers and Quantum Electronics
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Growth temperature dependence of semipolar {11-22} AlInN/GaInN
Sub Title (in English)
Keyword(1) semipolar
Keyword(2) {11-22}
Keyword(3) MOCVD
Keyword(4) AlInN
1st Author's Name Takahiro Fujisawa
1st Author's Affiliation Nagoya Institute of Technology(Nagoya Inst. Tech.)
2nd Author's Name Taiki Nakabayashi
2nd Author's Affiliation Nagoya Institute of Technology(Nagoya Inst. Tech.)
3rd Author's Name Takashi Egawa
3rd Author's Affiliation Nagoya Institute of Technology(Nagoya Inst. Tech.)
4th Author's Name Makoto Miyoshi
4th Author's Affiliation Nagoya Institute of Technology(Nagoya Inst. Tech.)
5th Author's Name Tetsuya Takeuchi
5th Author's Affiliation Meijo University(Meijo Univ.)
6th Author's Name Narihito Okada
6th Author's Affiliation Yamaguchi University(Yamaguchi Univ.)
7th Author's Name Kazuyuki Tadatomo
7th Author's Affiliation Yamaguchi University(Yamaguchi Univ.)
Date 2022-11-25
Paper # ED2022-42,CPM2022-67,LQE2022-75
Volume (vol) vol.122
Number (no) ED-271,CPM-272,LQE-273
Page pp.pp.81-84(ED), pp.81-84(CPM), pp.81-84(LQE),
#Pages 4
Date of Issue 2022-11-17 (ED, CPM, LQE)