Presentation | 2022-11-17 Optimal Maintenance Interval for DU Fault of Safety-Related System Shinji Inoue, Shigeru Yamada, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | R2022-41 |
Date of Issue | 2022-11-10 (R) |
Conference Information | |
Committee | R |
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Conference Date | 2022/11/17(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Reliability of semiconductor and electronic devices, Reliability general |
Chair | Tadashi Dohi(Hiroshima Univ.) |
Vice Chair | Yasushi Kadota(Ricoh) |
Secretary | Yasushi Kadota(Hiroshima Univ.) |
Assistant | Shinji Yokogawa(Univ. of Electro-Comm.) / Takahide Yoshikawa(Fujitsu Lab.) / Takenori Sakumura(Housei Univ.) |
Paper Information | |
Registration To | Technical Committee on Reliability |
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Language | ENG-JTITLE |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Optimal Maintenance Interval for DU Fault of Safety-Related System |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Shinji Inoue |
1st Author's Affiliation | Kansai University(Kansai Univ.) |
2nd Author's Name | Shigeru Yamada |
2nd Author's Affiliation | Tottori Univ(Tottori Univ.) |
Date | 2022-11-17 |
Paper # | R2022-41 |
Volume (vol) | vol.122 |
Number (no) | R-257 |
Page | pp.pp.7-12(R), |
#Pages | 6 |
Date of Issue | 2022-11-10 (R) |