Presentation 2022-11-17
Optimal Maintenance Interval for DU Fault of Safety-Related System
Shinji Inoue, Shigeru Yamada,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # R2022-41
Date of Issue 2022-11-10 (R)

Conference Information
Committee R
Conference Date 2022/11/17(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Reliability of semiconductor and electronic devices, Reliability general
Chair Tadashi Dohi(Hiroshima Univ.)
Vice Chair Yasushi Kadota(Ricoh)
Secretary Yasushi Kadota(Hiroshima Univ.)
Assistant Shinji Yokogawa(Univ. of Electro-Comm.) / Takahide Yoshikawa(Fujitsu Lab.) / Takenori Sakumura(Housei Univ.)

Paper Information
Registration To Technical Committee on Reliability
Language ENG-JTITLE
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optimal Maintenance Interval for DU Fault of Safety-Related System
Sub Title (in English)
Keyword(1)
1st Author's Name Shinji Inoue
1st Author's Affiliation Kansai University(Kansai Univ.)
2nd Author's Name Shigeru Yamada
2nd Author's Affiliation Tottori Univ(Tottori Univ.)
Date 2022-11-17
Paper # R2022-41
Volume (vol) vol.122
Number (no) R-257
Page pp.pp.7-12(R),
#Pages 6
Date of Issue 2022-11-10 (R)