Presentation 2022-11-11
[Invited Talk] Reliable design of SiC Power Modules
Shuhei Fukunaga, Alberto Castellazzi, Tsuyoshi Funaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # SDM2022-76
Date of Issue 2022-11-03 (SDM)

Conference Information
Committee SDM
Conference Date 2022/11/10(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Process, Device, Circuit simulation, etc.
Chair Shunichiro Ohmi(Tokyo Inst. of Tech.)
Vice Chair Tatsuya Usami(ASM Japan)
Secretary Tatsuya Usami(Tohoku Univ.)
Assistant Takuji Hosoi(Kwansei Gakuin Univ.) / Takuya Futase(SanDisk)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Talk] Reliable design of SiC Power Modules
Sub Title (in English) An Experimental Characterization for Aging Prediction
Keyword(1)
1st Author's Name Shuhei Fukunaga
1st Author's Affiliation Osaka University(Osaka Univ.)
2nd Author's Name Alberto Castellazzi
2nd Author's Affiliation Kyoto University of Advanced Science(KUAS)
3rd Author's Name Tsuyoshi Funaki
3rd Author's Affiliation Osaka University(Osaka Univ.)
Date 2022-11-11
Paper # SDM2022-76
Volume (vol) vol.122
Number (no) SDM-247
Page pp.pp.55-60(SDM),
#Pages 6
Date of Issue 2022-11-03 (SDM)