Presentation 2022-11-10
[Invited Talk] Optimum Design of Channel Material and Surface Orientation for Extremely-Thin-Body nMOSFETs under Nonlinear Modeling of Surface Roughness Scattering
Kei Sumita, Min-Soo Kang, Chia-Tsong Chen, Kasidit Toprasertpong, Mitsuru Takenaka, Shinichi Takagi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Extremely-thin-body (ETB) channels are regarded as the most promising channel structure for future CMOS technology nodes. In parallel, CMOS operation at low temperatures is demanded for the quantum computing and data center applications. Here, surface roughness (SR) scattering is a dominant scattering mechanism for such ETB channels and at low temperature. However, there is a challenge for the conventional linear model of SR scattering that the excessive roughness parameters are used in the linear model to explain the experiments. In this study, we have proposed a new model of surface roughness scattering including the nonlinearity of SR scattering, which can explain the experimental mobility of SOI, GOI and InAs-OI nMOSFETs by using roughness parameters obtained experimentally from TEM images. The material and surface orientation in ETB channels is optimized by calculating the mobility based on our nonlinear model. As a result, the anisotropic valley with heavy confinement mass is essentially important to suppress the SR scattering because of the low quantization energy fluctuation. In particular, (111) GOI is most expected thanks to the strong anisotropic L valley and have the excellent SR-limited and phonon-limited electron mobility even in the 2-nm-thick channels, which is an advantage over 2D materials.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Extremely-Thin-Body / Nanosheet / MOSFET / Surface Roughness Scattering / Mobility
Paper # SDM2022-65
Date of Issue 2022-11-03 (SDM)

Conference Information
Committee SDM
Conference Date 2022/11/10(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Process, Device, Circuit simulation, etc.
Chair Shunichiro Ohmi(Tokyo Inst. of Tech.)
Vice Chair Tatsuya Usami(ASM Japan)
Secretary Tatsuya Usami(Tohoku Univ.)
Assistant Takuji Hosoi(Kwansei Gakuin Univ.) / Takuya Futase(SanDisk)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Talk] Optimum Design of Channel Material and Surface Orientation for Extremely-Thin-Body nMOSFETs under Nonlinear Modeling of Surface Roughness Scattering
Sub Title (in English)
Keyword(1) Extremely-Thin-Body
Keyword(2) Nanosheet
Keyword(3) MOSFET
Keyword(4) Surface Roughness Scattering
Keyword(5) Mobility
1st Author's Name Kei Sumita
1st Author's Affiliation University of Tokyo(Univ. Tokyo)
2nd Author's Name Min-Soo Kang
2nd Author's Affiliation University of Tokyo(Univ. Tokyo)
3rd Author's Name Chia-Tsong Chen
3rd Author's Affiliation University of Tokyo(Univ. Tokyo)
4th Author's Name Kasidit Toprasertpong
4th Author's Affiliation University of Tokyo(Univ. Tokyo)
5th Author's Name Mitsuru Takenaka
5th Author's Affiliation University of Tokyo(Univ. Tokyo)
6th Author's Name Shinichi Takagi
6th Author's Affiliation University of Tokyo(Univ. Tokyo)
Date 2022-11-10
Paper # SDM2022-65
Volume (vol) vol.122
Number (no) SDM-247
Page pp.pp.7-12(SDM),
#Pages 6
Date of Issue 2022-11-03 (SDM)