| Presentation | 2022-10-12 A Don't Care Filling Algorithm of Control Signals for Concurrent Testing Xu Haofeng, Hosokawa Toshinori, Yoshimura Masayoshi, Arai Masayuki, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. Test compaction methods have been proposed to reduce the number of test patterns. Therefore, it is important to apply design-for-testability considering concurrent testing. A method such that a logic value assignment problem of don't cares (X) for controllers at register transfer level was formulated as pseudo-Boolean optimization problem to optimize concurrent testing for hardware elements in data-paths was proposed. The method showed that the number of test patterns was reduced for small high-level synthesis benchmark circuits. However, as the number of Xs in the control signal increases, it is difficult to obtain a solution in reasonable time. In this paper, we focus on concurrent testing of operational units whose number of required test patterns is dominant, and propose a heuristic algorithm that can perform concurrent testing of as many operational units as possible and reduce the number of state transitions used for testing as much as possible. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | control signals / don't care filling / concurrent testing / data-paths / heuristic algorithm |
| Paper # | CPSY2022-24,DC2022-24 |
| Date of Issue | 2022-10-04 (CPSY, DC) |
| Conference Information | |
| Committee | CPSY / DC / IPSJ-ARC |
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| Conference Date | 2022/10/11(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Yuzawa Toei Hotel |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | System Architecture, Computer Systems, Dependable Computing, etc. |
| Chair | Michihiro Koibuchi(NII) / Tatsuhiro Tsuchiya(Osaka Univ.) / Tomoaki Tsumura(Nagoya Inst. of Tech.) |
| Vice Chair | Kota Nakajima(Fujitsu Lab.) / Tomoaki Tsumura(Nagoya Inst. of Tech.) / Toshinori Hosokawa(Nihon Univ.) |
| Secretary | Kota Nakajima(JAIST) / Tomoaki Tsumura(Hitachi) / Toshinori Hosokawa(Nihon Univ.) / (Chiba Univ.) |
| Assistant | Ryohei Kobayashi(Tsukuba Univ.) / Takaaki Miyajima(Meiji Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System Architecture |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Don't Care Filling Algorithm of Control Signals for Concurrent Testing |
| Sub Title (in English) | |
| Keyword(1) | control signals |
| Keyword(2) | don't care filling |
| Keyword(3) | concurrent testing |
| Keyword(4) | data-paths |
| Keyword(5) | heuristic algorithm |
| 1st Author's Name | Xu Haofeng |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Hosokawa Toshinori |
| 2nd Author's Affiliation | Nihon University(Nihon Univ.) |
| 3rd Author's Name | Yoshimura Masayoshi |
| 3rd Author's Affiliation | Kyoto Sangyo University(KSU) |
| 4th Author's Name | Arai Masayuki |
| 4th Author's Affiliation | Nihon University(Nihon Univ.) |
| Date | 2022-10-12 |
| Paper # | CPSY2022-24,DC2022-24 |
| Volume (vol) | vol.122 |
| Number (no) | CPSY-204,DC-205 |
| Page | pp.pp.37-42(CPSY), pp.37-42(DC), |
| #Pages | 6 |
| Date of Issue | 2022-10-04 (CPSY, DC) |