Presentation | 2022-10-27 Investigation of magnetic structure of C11b Cr-Al thin film by magnetoresistance effect measurement Sota Iguchi, Sosuke Fujiwara, Kentaro Toyoki, Yu Shiratsuchi, Ryouichi Nakatani, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The enrichment of library for antiferromagnetic material is essential for the development of magnetoresistance (MR) devices and magnetic devices with THz operation. Neutron diffraction, which has been usually used to evaluate the magnetic structure of bulk antiferromagnets, is difficult to be applied to thin films. In this study, we investigated the magnetic structure of antiferromagnetic thin films via the current and magnetic field orientation dependence of the MR effect in C11b Cr2Al (001) thin films. As results, we confirmed the existence of the anomalous MR effect originating from the magnetic moment of Cr and inferred that the magnetic moment lies in the c-plane from the rotational symmetry. Further investigation is needed to determine the magnetic ordering in the c-plane. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Antiferromagnetic material / Magnetoresistive effect |
Paper # | MRIS2022-6,CPM2022-37 |
Date of Issue | 2022-10-20 (MRIS, CPM) |
Conference Information | |
Committee | MRIS / CPM / ITE-MMS |
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Conference Date | 2022/10/27(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Shinshu Univ. |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Spintronics, Solid State Memory, Functional material, Thin film process, Material, Devices, etc. |
Chair | Ikuya Tagawa(Tohoku Inst. of Tech.) / Yuichi Nakamura(Toyohashi Univ. of Tech.) |
Vice Chair | / Hideki Nakazawa(Hirosaki Univ.) |
Secretary | (Ehime Univ.) / Hideki Nakazawa(Samsung) / (Ehime Univ.) |
Assistant | Nobuaki Kikuchi(Tohoku Univ.) / Toshiki Yamaji(AIST) / Yasuo Kimura(Tokyo Univ. of Tech.) / Fumihiko Hirose(Yamagata Univ.) / Noriko Bamba(Shinshu Univ.) |
Paper Information | |
Registration To | Technical Committee on Magnetic Recording & Information Storage / Technical Committee on Component Parts and Materials / Technical Group on Multi-media Storage |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Investigation of magnetic structure of C11b Cr-Al thin film by magnetoresistance effect measurement |
Sub Title (in English) | |
Keyword(1) | Antiferromagnetic material |
Keyword(2) | Magnetoresistive effect |
1st Author's Name | Sota Iguchi |
1st Author's Affiliation | Osaka University(Osaka Univ.) |
2nd Author's Name | Sosuke Fujiwara |
2nd Author's Affiliation | Osaka University(Osaka Univ.) |
3rd Author's Name | Kentaro Toyoki |
3rd Author's Affiliation | Osaka University(Osaka Univ.) |
4th Author's Name | Yu Shiratsuchi |
4th Author's Affiliation | Osaka University(Osaka Univ.) |
5th Author's Name | Ryouichi Nakatani |
5th Author's Affiliation | Osaka University(Osaka Univ.) |
Date | 2022-10-27 |
Paper # | MRIS2022-6,CPM2022-37 |
Volume (vol) | vol.122 |
Number (no) | MRIS-230,CPM-231 |
Page | pp.pp.1-5(MRIS), pp.1-5(CPM), |
#Pages | 5 |
Date of Issue | 2022-10-20 (MRIS, CPM) |