Presentation 2022-10-14
Results of EMC round robin test on emission and immunity test
Yasushi Asaji, Hironobu Matsuyama, Toshiyasu Tanaka, Hirotsugu Hashimoto, Ryosuke Nakao, Kazusa Tanaka, Takuya Yamada,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In the previous report, we conducted interlaboratory comparison regarding to 80 MHz to 1 GHz radiated electromagnetic field immunity test compliant with IEC 61000-4-3 and discussed about difference of electric field distribution among test sites. This time, we executed 1 to 6 GHz test, and 12 test sites were participated. The electric field distribution at the uniform field area was a maximum range of 5.0 dB at the best performed test site and 10.8 dB at the worst. The maximum difference in field strength between the two test sites was up to more than 10 dB even at the same measurement position.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) EMC / Round robin test / Interlaboratory comparison test / Radiated electromagnetic field Immunity / IEC 61000-4-3
Paper # EMCJ2022-61,MW2022-107,EST2022-71
Date of Issue 2022-10-06 (EMCJ, MW, EST)

Conference Information
Committee EMCJ / MW / EST / IEE-EMC
Conference Date 2022/10/13(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Akita University
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Noriharu Suematsu(Tohoku Univ.) / Jun Shibayama(Hosei Univ.)
Vice Chair Kimihiro Tajima(NTT-AT) / Tadashi Kawai(Univ. of Hyogo) / Kensuke Okubo(Okayama Prefectural Univ.) / Hideyuki Nakamizo(Mitsubishi Electric) / Masayuki Kimishima(Advantest) / Yasuhide Tsuji(Muroran Inst. of Tech.) / Yasuo Ohtera(Toyama Prefectural Univ.)
Secretary Kimihiro Tajima(Hokkaido Univ.) / Tadashi Kawai(Hitachi) / Kensuke Okubo(Univ. of Electro-Comm) / Hideyuki Nakamizo(Toshiba) / Masayuki Kimishima(yoto Univ.) / Yasuhide Tsuji(Univ. of Electro-Comm) / Yasuo Ohtera
Assistant Kiyoto Matsushima(Hitachi) / Kenji Ogata(ADOX) / Toru Matsushima(Kyushu Inst. of Tech.) / Naoki Hasegawa(Softbank) / Kosuke Katayama(NIT Tokuyama College) / Seiya Kishimoto(Nihon Univ.) / Akito Iguchi(Muroran Inst. of Tech)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility / Technical Committee on Microwaves / Technical Committee on Electronics Simulation Technology / Technical Meeting on Electromagnetic Compatibility
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Results of EMC round robin test on emission and immunity test
Sub Title (in English) (4) Experimental results of 1-6 GHz radiated immunity round-robin test
Keyword(1) EMC
Keyword(2) Round robin test
Keyword(3) Interlaboratory comparison test
Keyword(4) Radiated electromagnetic field Immunity
Keyword(5) IEC 61000-4-3
1st Author's Name Yasushi Asaji
1st Author's Affiliation Murata Manufacturing Co., Ltd.(Murata Manufacturing)
2nd Author's Name Hironobu Matsuyama
2nd Author's Affiliation KEC Kansai Electronic Industry Development Center(KEC Kansai Electronic Industry Development Center)
3rd Author's Name Toshiyasu Tanaka
3rd Author's Affiliation Microwave Factory Co., Ltd.(Microwave Factory)
4th Author's Name Hirotsugu Hashimoto
4th Author's Affiliation RIKEN ENVIRONMENTAL SYSTEM Co., Ltd.(RES)
5th Author's Name Ryosuke Nakao
5th Author's Affiliation COSEL CO., LTD.(COSEL)
6th Author's Name Kazusa Tanaka
6th Author's Affiliation Chokuan Industry Development Center ADOX Fukuoka(ADOX Fukuoka)
7th Author's Name Takuya Yamada
7th Author's Affiliation FUJIFILM Business Innovation Corp.(FUJIFILM Business Innovation)
Date 2022-10-14
Paper # EMCJ2022-61,MW2022-107,EST2022-71
Volume (vol) vol.122
Number (no) EMCJ-206,MW-207,EST-208
Page pp.pp.130-135(EMCJ), pp.130-135(MW), pp.130-135(EST),
#Pages 6
Date of Issue 2022-10-06 (EMCJ, MW, EST)