| Presentation | 2022-07-27 A Block Partitioning Method to Accelerate Test Generation for Gate-Exhaustive Faults Momona Mizota, Toshinori Hosokawa, Masayoshi Yoshimura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In gate-exhaustive fault model which covers defects in cells, since the number of faults is proportion to that of gates, the numbers of faults and test patterns increase with the increasing in the number of gates. Therefore, for gate-exhaustive faults, a multiple target test generation method which is one of dynamic test compaction methods has been proposed to reduce the number of test patterns. However, the test generation time is problem. Also, region-exhaustive fault model which is defined in block units without defining faults in cell units has been proposed to reduce the number of faults for the test generation. Blocks where region-exhaustive faults are defined was configured such that the number of defined faults is smaller than that of gate -exhaustive faults. However, there are problems such as a decrease in fault coverage for region-exhaustive faults and an increase in the number of test patterns. In this paper, we propose a block partitioning method to reduce the number of region-exhaustive faults while maintaining fault coverage for gate-exhaustive faults. The experimental results for ISCAS89 benchmark circuits showed that the proposed block partitioning method reduced the test generation time by 37.94%, reduced the number of faults by 30.65%, reduced the number of test patterns by 16.75%, and increased the fault coverage for gate-exhaustive faults by 6.97% on average compared to the conventional block partitioning method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | gate-exhaustive fault model / multiple target test generation / region-exhaustive faults / block partitioning / untestable faults |
| Paper # | CPSY2022-3,DC2022-3 |
| Date of Issue | 2022-07-20 (CPSY, DC) |
| Conference Information | |
| Committee | CPSY / DC / IPSJ-ARC |
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| Conference Date | 2022/7/27(3days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kaikyo Messe Shimonoseki |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | SWoPP2022: Parallel, Distributed and Cooperative Processing Systems and Dependable Computing |
| Chair | Michihiro Koibuchi(NII) / Tatsuhiro Tsuchiya(Osaka Univ.) / 津邑 公暁(名工大) |
| Vice Chair | Kota Nakajima(Fujitsu Lab.) / Tomoaki Tsumura(Nagoya Inst. of Tech.) / Toshinori Hosokawa(Nihon Univ.) |
| Secretary | Kota Nakajima(JAIST) / Tomoaki Tsumura(Hitachi) / Toshinori Hosokawa(Nihon Univ.) / (Chiba Univ.) |
| Assistant | Ryohei Kobayashi(Tsukuba Univ.) / Takaaki Miyajima(Meiji Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System Architecture |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Block Partitioning Method to Accelerate Test Generation for Gate-Exhaustive Faults |
| Sub Title (in English) | |
| Keyword(1) | gate-exhaustive fault model |
| Keyword(2) | multiple target test generation |
| Keyword(3) | region-exhaustive faults |
| Keyword(4) | block partitioning |
| Keyword(5) | untestable faults |
| 1st Author's Name | Momona Mizota |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon University(Nihon Univ.) |
| 3rd Author's Name | Masayoshi Yoshimura |
| 3rd Author's Affiliation | Kyoto Sangyou University(Kyoto Sangyou Univ.) |
| Date | 2022-07-27 |
| Paper # | CPSY2022-3,DC2022-3 |
| Volume (vol) | vol.122 |
| Number (no) | CPSY-133,DC-134 |
| Page | pp.pp.13-18(CPSY), pp.13-18(DC), |
| #Pages | 6 |
| Date of Issue | 2022-07-20 (CPSY, DC) |