| Presentation | 2022-07-19 Security Evaluation of Cryptographic Circuits with Laser Sensors by Double-Spot Laser Irradiation Masaki Chikano, Naoki Yoshida, Junichi Sakamoto, Syungo Hayashi, Tsutomu Matsumoto, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A fault injection attack is an attack method that intentionally injects faults into a device to cause it to malfunction, and then attempts to observe the malfunction and analyze the internal confidential information. Attacks using laser irradiation, which enables precise fault injection, are particularly powerful, and development of countermeasures against them is required. In this article, we report the results of security evaluation by double-spot laser irradiation against an FPGA-implemented cryptographic circuit including a full-digital laser detection circuit proposed in a previous study, which is said to withstand a single laser irradiation attack. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Implementation Attack / Fault Injection Attack / Laser / Laser Detection / Security / FPGA |
| Paper # | ISEC2022-16,SITE2022-20,BioX2022-41,HWS2022-16,ICSS2022-24,EMM2022-24 |
| Date of Issue | 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM) |
| Conference Information | |
| Committee | EMM / BioX / ISEC / SITE / ICSS / HWS / IPSJ-CSEC / IPSJ-SPT |
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| Conference Date | 2022/7/19(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Ryoichi Nishimura(NICT) / Hitoshi Imaoka(NEC) / Noboru Kunihiro(Tsukuba Univ.) / Takushi Otani(Kibi International Univ.) / Katsunari Yoshioka(Yokohama National Univ.) / Makoto Nagata(Kobe Univ.) |
| Vice Chair | Kotaro Sonoda(Nagasaki Univ.) / Masatsugu Ichino(Univ. of Electro-Comm.) / Norihiko Okui(KDDI Research) / Naoyuki Takada(SECOM) / Junji Shikata(Yokohama National Univ.) / Goichiro Hanaoka(AIST) / Soichiro Morishita(Cyber Agent) / Takeo Tatsumi(Open Univ. of Japan) / Takahiro Kasama(NICT) / Yuichi Hayashi(NAIST) / Daisuke Suzuki(Mitsubishi Electric) |
| Secretary | Kotaro Sonoda(Kaishi Professional Univ.) / Masatsugu Ichino(Chiba Univ.) / Norihiko Okui(NEC) / Naoyuki Takada(MitsubishiElectric) / Junji Shikata(AIST) / Goichiro Hanaoka(Ibaraki Univ.) / Soichiro Morishita(NRI-Secure) / Takeo Tatsumi(Hokuriku Univ.) / Takahiro Kasama(KDDI labs.) / Yuichi Hayashi(Okayama Univ.) / Daisuke Suzuki(SSS) / (NAIST) |
| Assistant | Tomoko Kajiyama(Hiroshima City Univ.) / Shieyuki Sakazawa(Osaka Inst. of Tech.) / Hiroyuki Suzuki(Gunma Univ) / Shinichi Shirakawa(Yokohama National Univ.) / Yoshikazu Hanatani(Toshiba) / Yusuke Tachibana(Fukuoka Inst. of Tech.) / Keisuke Kito(Mitsubishi Electric) / Takeshi Sugawara(Univ. of Electro-Comm.) / Yo Kanemoto(NTT) |
| Paper Information | |
| Registration To | Technical Committee on Enriched MultiMedia / Technical Committee on Biometrics / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Hardware Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Security Evaluation of Cryptographic Circuits with Laser Sensors by Double-Spot Laser Irradiation |
| Sub Title (in English) | |
| Keyword(1) | Implementation Attack |
| Keyword(2) | Fault Injection Attack |
| Keyword(3) | Laser |
| Keyword(4) | Laser Detection |
| Keyword(5) | Security |
| Keyword(6) | FPGA |
| 1st Author's Name | Masaki Chikano |
| 1st Author's Affiliation | Yokohama National University(YNU) |
| 2nd Author's Name | Naoki Yoshida |
| 2nd Author's Affiliation | Yokohama National University(YNU) |
| 3rd Author's Name | Junichi Sakamoto |
| 3rd Author's Affiliation | Yokohama National University(YNU) |
| 4th Author's Name | Syungo Hayashi |
| 4th Author's Affiliation | Yokohama National University(YNU) |
| 5th Author's Name | Tsutomu Matsumoto |
| 5th Author's Affiliation | Yokohama National University(YNU) |
| Date | 2022-07-19 |
| Paper # | ISEC2022-16,SITE2022-20,BioX2022-41,HWS2022-16,ICSS2022-24,EMM2022-24 |
| Volume (vol) | vol.122 |
| Number (no) | ISEC-122,SITE-123,BioX-124,HWS-125,ICSS-126,EMM-127 |
| Page | pp.pp.52-57(ISEC), pp.52-57(SITE), pp.52-57(BioX), pp.52-57(HWS), pp.52-57(ICSS), pp.52-57(EMM), |
| #Pages | 6 |
| Date of Issue | 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM) |