Presentation 2022-07-19
Security Assessment and Countermeasures for Magnetic Malfunction of Electromagnetic Relays
Takumi Owada, Kazuki Tachibana, Tsutomu Matsumoto,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Relays are used in many electrical and electronic devices, including switches and sensors. Some relays are electromagnetic relays, which switch circuits open and closed by operating the contacts with electromagnets. An attacker could illegally connect the contacts by applying a strong magnetic field to the electromagnetic relay and manipulate the system. Although this type of attack has the potential to pose a significant threat, there have been no explicit examples of intentional malfunctions caused by magnetostatic fields from a security perspective. In this report, we show clearly that electromagnetic relay malfunctions can be caused by the use of strong magnets even from outside the equipment containing the relay, and discuss attacks using static magnetic fields on electromagnetic relays and countermeasures against them.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) EMC / electromagnetic relay / electromagnet / permanent magnet / magnetostatic field / security
Paper # ISEC2022-14,SITE2022-18,BioX2022-39,HWS2022-14,ICSS2022-22,EMM2022-22
Date of Issue 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM)

Conference Information
Committee EMM / BioX / ISEC / SITE / ICSS / HWS / IPSJ-CSEC / IPSJ-SPT
Conference Date 2022/7/19(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Ryoichi Nishimura(NICT) / Hitoshi Imaoka(NEC) / Noboru Kunihiro(Tsukuba Univ.) / Takushi Otani(Kibi International Univ.) / Katsunari Yoshioka(Yokohama National Univ.) / Makoto Nagata(Kobe Univ.)
Vice Chair Kotaro Sonoda(Nagasaki Univ.) / Masatsugu Ichino(Univ. of Electro-Comm.) / Norihiko Okui(KDDI Research) / Naoyuki Takada(SECOM) / Junji Shikata(Yokohama National Univ.) / Goichiro Hanaoka(AIST) / Soichiro Morishita(Cyber Agent) / Takeo Tatsumi(Open Univ. of Japan) / Takahiro Kasama(NICT) / Yuichi Hayashi(NAIST) / Daisuke Suzuki(Mitsubishi Electric)
Secretary Kotaro Sonoda(Kaishi Professional Univ.) / Masatsugu Ichino(Chiba Univ.) / Norihiko Okui(NEC) / Naoyuki Takada(MitsubishiElectric) / Junji Shikata(AIST) / Goichiro Hanaoka(Ibaraki Univ.) / Soichiro Morishita(NRI-Secure) / Takeo Tatsumi(Hokuriku Univ.) / Takahiro Kasama(KDDI labs.) / Yuichi Hayashi(Okayama Univ.) / Daisuke Suzuki(SSS) / (NAIST)
Assistant Tomoko Kajiyama(Hiroshima City Univ.) / Shieyuki Sakazawa(Osaka Inst. of Tech.) / Hiroyuki Suzuki(Gunma Univ) / Shinichi Shirakawa(Yokohama National Univ.) / Yoshikazu Hanatani(Toshiba) / Yusuke Tachibana(Fukuoka Inst. of Tech.) / Keisuke Kito(Mitsubishi Electric) / Takeshi Sugawara(Univ. of Electro-Comm.) / Yo Kanemoto(NTT)

Paper Information
Registration To Technical Committee on Enriched MultiMedia / Technical Committee on Biometrics / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Hardware Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Security Assessment and Countermeasures for Magnetic Malfunction of Electromagnetic Relays
Sub Title (in English)
Keyword(1) EMC
Keyword(2) electromagnetic relay
Keyword(3) electromagnet
Keyword(4) permanent magnet
Keyword(5) magnetostatic field
Keyword(6) security
1st Author's Name Takumi Owada
1st Author's Affiliation Yokohama National University(YNU)
2nd Author's Name Kazuki Tachibana
2nd Author's Affiliation Yokohama National University(YNU)
3rd Author's Name Tsutomu Matsumoto
3rd Author's Affiliation Yokohama National University(YNU)
Date 2022-07-19
Paper # ISEC2022-14,SITE2022-18,BioX2022-39,HWS2022-14,ICSS2022-22,EMM2022-22
Volume (vol) vol.122
Number (no) ISEC-122,SITE-123,BioX-124,HWS-125,ICSS-126,EMM-127
Page pp.pp.40-45(ISEC), pp.40-45(SITE), pp.40-45(BioX), pp.40-45(HWS), pp.40-45(ICSS), pp.40-45(EMM),
#Pages 6
Date of Issue 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM)