Presentation 2022-07-19
Randomness evaluation of TERO-based TRNG with a side-channel attack countermeasure
Saki Osuka, Daisuke Fujimoto, Yuichi Hayashi, Shinichi Kawamura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) True random number generators (TRNGs) based on ring oscillators (ROs) are employed in many devices because they can be constructed by logic gates. The randomness of TRNG must be uniform, unreproducible, and unpredictable, and the quality of random numbers is very important in cryptographic protocols. If the unpredictability of TRNG is reduced and the output bits of TRNG used in the cryptographic protocol can be estimated, the security of the entire system can be significantly reduced. The authors showed the possibility of predicting the output bits by a side-channel attack against TERO-based TRNG, and proposed its countermeasures at SCIS2020. In this study, we performed a statistical test of random number sequences generated by TERO-based TRNGs that are resistant to side-channel attacks and mathematically analyzed the effectiveness of countermeasures against random number bias.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) true random number generator / randomness evaluation
Paper # ISEC2022-9,SITE2022-13,BioX2022-34,HWS2022-9,ICSS2022-17,EMM2022-17
Date of Issue 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM)

Conference Information
Committee EMM / BioX / ISEC / SITE / ICSS / HWS / IPSJ-CSEC / IPSJ-SPT
Conference Date 2022/7/19(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Ryoichi Nishimura(NICT) / Hitoshi Imaoka(NEC) / Noboru Kunihiro(Tsukuba Univ.) / Takushi Otani(Kibi International Univ.) / Katsunari Yoshioka(Yokohama National Univ.) / Makoto Nagata(Kobe Univ.)
Vice Chair Kotaro Sonoda(Nagasaki Univ.) / Masatsugu Ichino(Univ. of Electro-Comm.) / Norihiko Okui(KDDI Research) / Naoyuki Takada(SECOM) / Junji Shikata(Yokohama National Univ.) / Goichiro Hanaoka(AIST) / Soichiro Morishita(Cyber Agent) / Takeo Tatsumi(Open Univ. of Japan) / Takahiro Kasama(NICT) / Yuichi Hayashi(NAIST) / Daisuke Suzuki(Mitsubishi Electric)
Secretary Kotaro Sonoda(Kaishi Professional Univ.) / Masatsugu Ichino(Chiba Univ.) / Norihiko Okui(NEC) / Naoyuki Takada(MitsubishiElectric) / Junji Shikata(AIST) / Goichiro Hanaoka(Ibaraki Univ.) / Soichiro Morishita(NRI-Secure) / Takeo Tatsumi(Hokuriku Univ.) / Takahiro Kasama(KDDI labs.) / Yuichi Hayashi(Okayama Univ.) / Daisuke Suzuki(SSS) / (NAIST)
Assistant Tomoko Kajiyama(Hiroshima City Univ.) / Shieyuki Sakazawa(Osaka Inst. of Tech.) / Hiroyuki Suzuki(Gunma Univ) / Shinichi Shirakawa(Yokohama National Univ.) / Yoshikazu Hanatani(Toshiba) / Yusuke Tachibana(Fukuoka Inst. of Tech.) / Keisuke Kito(Mitsubishi Electric) / Takeshi Sugawara(Univ. of Electro-Comm.) / Yo Kanemoto(NTT)

Paper Information
Registration To Technical Committee on Enriched MultiMedia / Technical Committee on Biometrics / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Hardware Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Randomness evaluation of TERO-based TRNG with a side-channel attack countermeasure
Sub Title (in English)
Keyword(1) true random number generator
Keyword(2) randomness evaluation
1st Author's Name Saki Osuka
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
2nd Author's Name Daisuke Fujimoto
2nd Author's Affiliation Nara Institute of Science and Technology(NAIST)
3rd Author's Name Yuichi Hayashi
3rd Author's Affiliation Nara Institute of Science and Technology(NAIST)
4th Author's Name Shinichi Kawamura
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
Date 2022-07-19
Paper # ISEC2022-9,SITE2022-13,BioX2022-34,HWS2022-9,ICSS2022-17,EMM2022-17
Volume (vol) vol.122
Number (no) ISEC-122,SITE-123,BioX-124,HWS-125,ICSS-126,EMM-127
Page pp.pp.13-17(ISEC), pp.13-17(SITE), pp.13-17(BioX), pp.13-17(HWS), pp.13-17(ICSS), pp.13-17(EMM),
#Pages 5
Date of Issue 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM)