| Presentation | 2022-07-19 Issues and Considerations for Improvement of Verification in ECDSA Attestation of Intel SGX Yagawa Takashi, Suzaki Kuniyasu, Teruya Tadanori, Ohara Kazuma, Abe Hirotake, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Intel SGX is a kind of TEE (Trusted Execution Environment) and can protect the confidentiality and integrity of programs and data in the memory of SGX from attacks involving privileged instructions from the OS, hypervisor, etc. SGX offers Remote Attestation (RA), which confirms the authenticity of the genuine platform and intended software on SGX (i.e., TA: Trusted Application).In recent years, SGX is utilized for the clouds, SGX RA is also developed for Cloud in 2018; the Elliptic Curve Digital Signature Algorithm (ECDSA) Attestation, which is intended for use in data centers. However, the degree of freedom of implementation is higher than in the past, and it is unclear who guarantees the verification results. This paper describes the provisioning and execution of the current ECDSA Attestation and clarifies who guarantees the verified elements. Furthermore, from this, the challenges of ECDSA Attestation will be identified, and then measures for improvement will be discussed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Remote Attestation / Intel SGX |
| Paper # | ISEC2022-11,SITE2022-15,BioX2022-36,HWS2022-11,ICSS2022-19,EMM2022-19 |
| Date of Issue | 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM) |
| Conference Information | |
| Committee | EMM / BioX / ISEC / SITE / ICSS / HWS / IPSJ-CSEC / IPSJ-SPT |
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| Conference Date | 2022/7/19(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Ryoichi Nishimura(NICT) / Hitoshi Imaoka(NEC) / Noboru Kunihiro(Tsukuba Univ.) / Takushi Otani(Kibi International Univ.) / Katsunari Yoshioka(Yokohama National Univ.) / Makoto Nagata(Kobe Univ.) |
| Vice Chair | Kotaro Sonoda(Nagasaki Univ.) / Masatsugu Ichino(Univ. of Electro-Comm.) / Norihiko Okui(KDDI Research) / Naoyuki Takada(SECOM) / Junji Shikata(Yokohama National Univ.) / Goichiro Hanaoka(AIST) / Soichiro Morishita(Cyber Agent) / Takeo Tatsumi(Open Univ. of Japan) / Takahiro Kasama(NICT) / Yuichi Hayashi(NAIST) / Daisuke Suzuki(Mitsubishi Electric) |
| Secretary | Kotaro Sonoda(Kaishi Professional Univ.) / Masatsugu Ichino(Chiba Univ.) / Norihiko Okui(NEC) / Naoyuki Takada(MitsubishiElectric) / Junji Shikata(AIST) / Goichiro Hanaoka(Ibaraki Univ.) / Soichiro Morishita(NRI-Secure) / Takeo Tatsumi(Hokuriku Univ.) / Takahiro Kasama(KDDI labs.) / Yuichi Hayashi(Okayama Univ.) / Daisuke Suzuki(SSS) / (NAIST) |
| Assistant | Tomoko Kajiyama(Hiroshima City Univ.) / Shieyuki Sakazawa(Osaka Inst. of Tech.) / Hiroyuki Suzuki(Gunma Univ) / Shinichi Shirakawa(Yokohama National Univ.) / Yoshikazu Hanatani(Toshiba) / Yusuke Tachibana(Fukuoka Inst. of Tech.) / Keisuke Kito(Mitsubishi Electric) / Takeshi Sugawara(Univ. of Electro-Comm.) / Yo Kanemoto(NTT) |
| Paper Information | |
| Registration To | Technical Committee on Enriched MultiMedia / Technical Committee on Biometrics / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Hardware Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Issues and Considerations for Improvement of Verification in ECDSA Attestation of Intel SGX |
| Sub Title (in English) | |
| Keyword(1) | Remote Attestation |
| Keyword(2) | Intel SGX |
| 1st Author's Name | Yagawa Takashi |
| 1st Author's Affiliation | University of Tsukuba(Tsukuba Univ.) |
| 2nd Author's Name | Suzaki Kuniyasu |
| 2nd Author's Affiliation | National Instituteof Advanced Industrial Science and Technology(AIST) |
| 3rd Author's Name | Teruya Tadanori |
| 3rd Author's Affiliation | National Instituteof Advanced Industrial Science and Technology(AIST) |
| 4th Author's Name | Ohara Kazuma |
| 4th Author's Affiliation | National Instituteof Advanced Industrial Science and Technology(AIST) |
| 5th Author's Name | Abe Hirotake |
| 5th Author's Affiliation | University of Tsukuba(Tsukuba Univ.) |
| Date | 2022-07-19 |
| Paper # | ISEC2022-11,SITE2022-15,BioX2022-36,HWS2022-11,ICSS2022-19,EMM2022-19 |
| Volume (vol) | vol.122 |
| Number (no) | ISEC-122,SITE-123,BioX-124,HWS-125,ICSS-126,EMM-127 |
| Page | pp.pp.23-28(ISEC), pp.23-28(SITE), pp.23-28(BioX), pp.23-28(HWS), pp.23-28(ICSS), pp.23-28(EMM), |
| #Pages | 6 |
| Date of Issue | 2022-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM) |