| Presentation | 2022-06-07 290 Mrad total-ionizing-dose tolerance experiment for an optically reconfigurable gate array VLSI Kaho Yamada, Takeshi Okazaki, Minoru Watanabe, Nobuya Watanabe, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | RECONF2022-7 |
| Date of Issue | 2022-05-31 (RECONF) |
| Conference Information | |
| Committee | RECONF |
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| Conference Date | 2022/6/7(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | CCS, Univ. of Tsukuba |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Reconfigurable system, etc. |
| Chair | Kentaro Sano(RIKEN) |
| Vice Chair | Yoshiki Yamaguchi(Tsukuba Univ.) / Tomonori Izumi(Ritsumeikan Univ.) |
| Secretary | Yoshiki Yamaguchi(NEC) / Tomonori Izumi(Toyohashi Univ. of Tech.) |
| Assistant | Yukitaka Takemura(INTEL) / Yasunori Osana(Ryukyu Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Reconfigurable Systems |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | 290 Mrad total-ionizing-dose tolerance experiment for an optically reconfigurable gate array VLSI |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Kaho Yamada |
| 1st Author's Affiliation | Okayama University(Okayama Univ.) |
| 2nd Author's Name | Takeshi Okazaki |
| 2nd Author's Affiliation | Okayama University(Okayama Univ.) |
| 3rd Author's Name | Minoru Watanabe |
| 3rd Author's Affiliation | Okayama University(Okayama Univ.) |
| 4th Author's Name | Nobuya Watanabe |
| 4th Author's Affiliation | Okayama University(Okayama Univ.) |
| Date | 2022-06-07 |
| Paper # | RECONF2022-7 |
| Volume (vol) | vol.122 |
| Number (no) | RECONF-60 |
| Page | pp.pp.37-40(RECONF), |
| #Pages | 4 |
| Date of Issue | 2022-05-31 (RECONF) |