Presentation 2022-05-27
Wet etching of GaN utilizing a photo-electrochemical reaction for functional materials
Taketomo Sato, Masachika Toguchi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A gallium nitride (GaN) porous structure was formed by wet etching utilizing electrochemical reactions. The refractive index of the GaN porous layer can be controlled by the porosity or aperture ratio, and its optical reflectance decreases depending on that. The incident-photon-to-current conversion efficiency (IPCE) of the interface between the GaN porous structure and the electrolyte increased by about 40% compared to that obtained on the unprocessed sample, and the basic absorption edge of the GaN porous structure was shifted in the long-wavelength direction. These characteristics of the GaN porous structure that has the high crystal quality are useful as a functional material.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Gallium Nitride / Electrochemical Etching / Porous Structure
Paper # ED2022-13,CPM2022-7,SDM2022-20
Date of Issue 2022-05-20 (ED, CPM, SDM)

Conference Information
Committee SDM / ED / CPM
Conference Date 2022/5/27(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Functional Device Materials, Fabrication, Characterization, and Related Technology
Chair Hiroshige Hirano(TowerPartners Semiconductor) / Hiroki Fujishiro(Tokyo Univ. of Science) / Yuichi Nakamura(Toyohashi Univ. of Tech.)
Vice Chair Shunichiro Ohmi(Tokyo Inst. of Tech.) / Seiya Sakai(Hokkaido Univ.) / Hideki Nakazawa(Hirosaki Univ.)
Secretary Shunichiro Ohmi(AIST) / Seiya Sakai(Nihon Univ.) / Hideki Nakazawa(Fjitsu Lab.)
Assistant Taiji Noda(Panasonic) / Tomoyuki Suwa(Tohoku Univ.) / Ryota Isonoi(SCIOCS) / Yoshitugu Yamamoto(Mitsubishi Electric) / Yasuo Kimura(Tokyo Univ. of Tech.) / Fumihiko Hirose(Yamagata Univ.) / Noriko Bamba(Shinshu Univ.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials / Technical Committee on Electron Devices / Technical Committee on Component Parts and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Wet etching of GaN utilizing a photo-electrochemical reaction for functional materials
Sub Title (in English)
Keyword(1) Gallium Nitride
Keyword(2) Electrochemical Etching
Keyword(3) Porous Structure
1st Author's Name Taketomo Sato
1st Author's Affiliation Hokkaido University(Hokkaido Univ.)
2nd Author's Name Masachika Toguchi
2nd Author's Affiliation Hokkaido University(Hokkaido Univ.)
Date 2022-05-27
Paper # ED2022-13,CPM2022-7,SDM2022-20
Volume (vol) vol.122
Number (no) ED-52,CPM-53,SDM-54
Page pp.pp.25-28(ED), pp.25-28(CPM), pp.25-28(SDM),
#Pages 4
Date of Issue 2022-05-20 (ED, CPM, SDM)