| Presentation | 2022-05-27 Characterization method of semiconductors under Ohmic-metals by using multi-probe Hall devices Kazuya Uryu, Shota Kiuchi, Taku Sato, Toshi-kazu Suzuki, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | AlGaN/GaN / Ohmic contact / multi-probe Hall measurement |
| Paper # | ED2022-15,CPM2022-9,SDM2022-22 |
| Date of Issue | 2022-05-20 (ED, CPM, SDM) |
| Conference Information | |
| Committee | SDM / ED / CPM |
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| Conference Date | 2022/5/27(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Functional Device Materials, Fabrication, Characterization, and Related Technology |
| Chair | Hiroshige Hirano(TowerPartners Semiconductor) / Hiroki Fujishiro(Tokyo Univ. of Science) / Yuichi Nakamura(Toyohashi Univ. of Tech.) |
| Vice Chair | Shunichiro Ohmi(Tokyo Inst. of Tech.) / Seiya Sakai(Hokkaido Univ.) / Hideki Nakazawa(Hirosaki Univ.) |
| Secretary | Shunichiro Ohmi(AIST) / Seiya Sakai(Nihon Univ.) / Hideki Nakazawa(Fjitsu Lab.) |
| Assistant | Taiji Noda(Panasonic) / Tomoyuki Suwa(Tohoku Univ.) / Ryota Isonoi(SCIOCS) / Yoshitugu Yamamoto(Mitsubishi Electric) / Yasuo Kimura(Tokyo Univ. of Tech.) / Fumihiko Hirose(Yamagata Univ.) / Noriko Bamba(Shinshu Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Silicon Device and Materials / Technical Committee on Electron Devices / Technical Committee on Component Parts and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Characterization method of semiconductors under Ohmic-metals by using multi-probe Hall devices |
| Sub Title (in English) | |
| Keyword(1) | AlGaN/GaN |
| Keyword(2) | Ohmic contact |
| Keyword(3) | multi-probe Hall measurement |
| 1st Author's Name | Kazuya Uryu |
| 1st Author's Affiliation | Japan Advanced Institute of Science and Technology/Advantest Laboratories Ltd.(JAIST/ATL) |
| 2nd Author's Name | Shota Kiuchi |
| 2nd Author's Affiliation | Japan Advanced Institute of Science and Technology(JAIST) |
| 3rd Author's Name | Taku Sato |
| 3rd Author's Affiliation | Advantest Laboratories Ltd.(ATL) |
| 4th Author's Name | Toshi-kazu Suzuki |
| 4th Author's Affiliation | Japan Advanced Institute of Science and Technology(JAIST) |
| Date | 2022-05-27 |
| Paper # | ED2022-15,CPM2022-9,SDM2022-22 |
| Volume (vol) | vol.122 |
| Number (no) | ED-52,CPM-53,SDM-54 |
| Page | pp.pp.35-38(ED), pp.35-38(CPM), pp.35-38(SDM), |
| #Pages | 4 |
| Date of Issue | 2022-05-20 (ED, CPM, SDM) |