| Presentation | 2022-04-23 Direct Observation and Evaluation of In-gap States of Inorganic and Organic Semiconductors via High-sensitivity UV Photoelectron Spectroscopy Ryotaro Nakazawa, Kenta Watanabe, Yuya Tanaka, Hisao Ishii, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The properties of devices based on inorganic and organic semiconductors are often greatly affected by in-gap states that are located in the forbidden band gap, and a method to accurately determine the density of states (DOS) of them are required. Therefore, we have developed highly sensitive ultraviolet photoelectron spectroscopy method (HS-UPS), in which UPS measurement are repeatedly performed by changing wavelength of an incident light. Combined with constant final state yield spectroscopy method (CFS-YS), which measures the yield of photoelectrons with constant kinetic energy while changing the wavelength of the incident light, it is possible to directly determine DOS of in the gap states down to around the Fermi energy. In my talk, I will discuss applications and usefulness of HS-UPS to organic and inorganic semiconductors. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | High Sensitivity Ultraviolet Photoemission Spectroscopy / In-Gap States / Organic Semiconductor / Inorganic semiconductor |
| Paper # | SDM2022-11,OME2022-11 |
| Date of Issue | 2022-04-15 (SDM, OME) |
| Conference Information | |
| Committee | OME / SDM |
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| Conference Date | 2022/4/22(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Takachiho Hall |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Thin film devices (Si, compound, organic, flexible), Biotechnology, Materials, Characterization, etc. |
| Chair | Toshiki Yamada(NICT) / Hiroshige Hirano(TowerPartners Semiconductor) |
| Vice Chair | Eiji Itoh(Shinshu Univ.) / Shunichiro Ohmi(Tokyo Inst. of Tech.) |
| Secretary | Eiji Itoh(Osaka Univ.) / Shunichiro Ohmi(Tokyo Univ. of Agriculture and Tech.) |
| Assistant | Yoshiyuki Seike(Aichi Inst. of Tech.) / Akira Baba(Niigata Univ.) / Taiji Noda(Panasonic) / Tomoyuki Suwa(Tohoku Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Organic Molecular Electronics / Technical Committee on Silicon Device and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Direct Observation and Evaluation of In-gap States of Inorganic and Organic Semiconductors via High-sensitivity UV Photoelectron Spectroscopy |
| Sub Title (in English) | |
| Keyword(1) | High Sensitivity Ultraviolet Photoemission Spectroscopy |
| Keyword(2) | In-Gap States |
| Keyword(3) | Organic Semiconductor |
| Keyword(4) | Inorganic semiconductor |
| 1st Author's Name | Ryotaro Nakazawa |
| 1st Author's Affiliation | Chiba University(Chiba Univ.) |
| 2nd Author's Name | Kenta Watanabe |
| 2nd Author's Affiliation | Chiba University(Chiba Univ.) |
| 3rd Author's Name | Yuya Tanaka |
| 3rd Author's Affiliation | Chiba University(Chiba Univ.) |
| 4th Author's Name | Hisao Ishii |
| 4th Author's Affiliation | Chiba University(Chiba Univ.) |
| Date | 2022-04-23 |
| Paper # | SDM2022-11,OME2022-11 |
| Volume (vol) | vol.122 |
| Number (no) | SDM-8,OME-9 |
| Page | pp.pp.51-56(SDM), pp.51-56(OME), |
| #Pages | 6 |
| Date of Issue | 2022-04-15 (SDM, OME) |