| Presentation | 2022-03-01 Applicability Evaluation of the Delay Testable Circuit to PUF Eisuke Ohama, Haruka Chino, Hiroyuki Yotuyanagi, Masaki Hashizume, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | DC2021-68 |
| Date of Issue | 2022-02-22 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2022/3/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Hiroshi Takahashi(Ehime Univ.) |
| Vice Chair | Tatsuhiro Tsuchiya(Osaka Univ.) |
| Secretary | Tatsuhiro Tsuchiya(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Applicability Evaluation of the Delay Testable Circuit to PUF |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Eisuke Ohama |
| 1st Author's Affiliation | Tokushima University(Tokushima Univ.) |
| 2nd Author's Name | Haruka Chino |
| 2nd Author's Affiliation | Tokushima University(Tokushima Univ.) |
| 3rd Author's Name | Hiroyuki Yotuyanagi |
| 3rd Author's Affiliation | Tokushima University(Tokushima Univ.) |
| 4th Author's Name | Masaki Hashizume |
| 4th Author's Affiliation | Tokushima University(Tokushima Univ.) |
| Date | 2022-03-01 |
| Paper # | DC2021-68 |
| Volume (vol) | vol.121 |
| Number (no) | DC-388 |
| Page | pp.pp.24-29(DC), |
| #Pages | 6 |
| Date of Issue | 2022-02-22 (DC) |