Presentation 2022-03-01
Delay Fault Test Pattern Generation of Fault Tolerant Design Using Approximate Computing
Koji Makino, Hiroyuki Yotsuyanagi, Masaki Hashizume,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # DC2021-71
Date of Issue 2022-02-22 (DC)

Conference Information
Committee DC
Conference Date 2022/3/1(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hiroshi Takahashi(Ehime Univ.)
Vice Chair Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Tatsuhiro Tsuchiya(Nihon Univ.)
Assistant

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Delay Fault Test Pattern Generation of Fault Tolerant Design Using Approximate Computing
Sub Title (in English)
Keyword(1)
1st Author's Name Koji Makino
1st Author's Affiliation Tokushima University(Tokushima Univ.)
2nd Author's Name Hiroyuki Yotsuyanagi
2nd Author's Affiliation Tokushima University(Tokushima Univ.)
3rd Author's Name Masaki Hashizume
3rd Author's Affiliation Tokushima University(Tokushima Univ.)
Date 2022-03-01
Paper # DC2021-71
Volume (vol) vol.121
Number (no) DC-388
Page pp.pp.39-44(DC),
#Pages 6
Date of Issue 2022-02-22 (DC)