| Presentation | 2022-03-04 Axial Alignment and Focus Adjustment of Lens System and Dielectric Anisotropy Measurement Method for Sheet Materials Using Parallel Millimeter-wave Beam Ryutaro Oba, Atsuhiro Nishikata, Masataka Midori, Hiroshi Kurihara, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In the case of an anisotropic dielectric material such as a printed circuit board, the dielectric constant changes with the direction of the transmission line, so it is necessary to understand the dielectric constant as a tensor in the circuit board design where the phase difference of the signal is an issue. In this report, we studied the adjustment method of the axis alignment and focus adjustment of the measurement system in the parallel millimeter-wave beam method using dielectric lens. We confirmed that the parallel beam part is close to the perpendicularly incident plane wave. Furthermore, we measured the transmission $S_{21}$ parameter, which changes when sheet materials is rotated around the beam axis, and thereby estimated the main value of the complex permittivity tensor. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Parallel beam method / Dielectric permittivity anisotropy / Dielectric lens / Axis alignment / Focus adjustment |
| Paper # | EMCJ2021-77 |
| Date of Issue | 2022-02-25 (EMCJ) |
| Conference Information | |
| Committee | MICT / EMCJ |
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| Conference Date | 2022/3/4(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Healthcare and Medical Information Communication Technologies, EMC, etc |
| Chair | Eisuke Hanada(Saga Univ.) / Atsuhiro Nishikata(Tokyo Inst. of Tech.) |
| Vice Chair | Hirokazu Tanaka(Hiroshima City Univ.) / Daisuke Anzai(Nagoya Inst. of Tech.) / Kimihiro Tajima(NTT-AT) |
| Secretary | Hirokazu Tanaka(Yokohama National Univ.) / Daisuke Anzai(KISTEC) / Kimihiro Tajima(NAIST) |
| Assistant | Takahiro Ito(Hiroshima City Univ) / Kento Takabayashi(Okayama Pref. Univ.) / Takuya Nishikawa(National Cerebral and Cardiovascular Center Hospital) / Kiyoto Matsushima(Hitachi) / Hiroyoshi Shida(EMC Tech.) / Toru Matsushima(Kyushu Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Healthcare and Medical Information Communication Technology / Technical Committee on Electromagnetic Compatibility |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Axial Alignment and Focus Adjustment of Lens System and Dielectric Anisotropy Measurement Method for Sheet Materials Using Parallel Millimeter-wave Beam |
| Sub Title (in English) | |
| Keyword(1) | Parallel beam method |
| Keyword(2) | Dielectric permittivity anisotropy |
| Keyword(3) | Dielectric lens |
| Keyword(4) | Axis alignment |
| Keyword(5) | Focus adjustment |
| 1st Author's Name | Ryutaro Oba |
| 1st Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
| 2nd Author's Name | Atsuhiro Nishikata |
| 2nd Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
| 3rd Author's Name | Masataka Midori |
| 3rd Author's Affiliation | TDK Corporation(TDK) |
| 4th Author's Name | Hiroshi Kurihara |
| 4th Author's Affiliation | TDK Corporation(TDK) |
| Date | 2022-03-04 |
| Paper # | EMCJ2021-77 |
| Volume (vol) | vol.121 |
| Number (no) | EMCJ-403 |
| Page | pp.pp.21-26(EMCJ), |
| #Pages | 6 |
| Date of Issue | 2022-02-25 (EMCJ) |