Presentation 2022-03-01
SAT-based LFSR Seed Generation for Delay Fault BIST
Kotaro Iwamoto, Satoshi Ohtake,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) So far, a one-pass LFSR seed generation method for delay fault BIST has been proposed. The method directly generates seeds by using ATPG and avoids unsuccessful encoding of conventional two-pass generation methods. However, there is a problem that a commercial ATPG cannot achieve acceptable fault coverage with reasonable time because of the complexity of the one-pass seed generation model which constrains ATPG based on LFSR functionality. In this paper, the one-pass seed generation model is extended so that it can be applied to SAT-based ATPG, and an LFSR seed generation method using SAT-based ATPG for delay faults is proposed. The effectiveness of the proposed method is evaluated through experiments using the ITC'99 benchmark circuits. The results show that the proposed method achieves complete fault efficiency for random pattern resistant faults.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SAT-based ATPG / scan based BIST / LFSR / seed generation / delay fault testing
Paper # DC2021-74
Date of Issue 2022-02-22 (DC)

Conference Information
Committee DC
Conference Date 2022/3/1(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hiroshi Takahashi(Ehime Univ.)
Vice Chair Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Tatsuhiro Tsuchiya(Nihon Univ.)

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) SAT-based LFSR Seed Generation for Delay Fault BIST
Sub Title (in English)
Keyword(1) SAT-based ATPG
Keyword(2) scan based BIST
Keyword(3) LFSR
Keyword(4) seed generation
Keyword(5) delay fault testing
1st Author's Name Kotaro Iwamoto
1st Author's Affiliation Oita University(Oita Univ.)
2nd Author's Name Satoshi Ohtake
2nd Author's Affiliation Oita University(Oita Univ.)
Date 2022-03-01
Paper # DC2021-74
Volume (vol) vol.121
Number (no) DC-388
Page pp.pp.57-62(DC),
#Pages 6
Date of Issue 2022-02-22 (DC)