| Presentation | 2022-03-01 SAT-based LFSR Seed Generation for Delay Fault BIST Kotaro Iwamoto, Satoshi Ohtake, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | So far, a one-pass LFSR seed generation method for delay fault BIST has been proposed. The method directly generates seeds by using ATPG and avoids unsuccessful encoding of conventional two-pass generation methods. However, there is a problem that a commercial ATPG cannot achieve acceptable fault coverage with reasonable time because of the complexity of the one-pass seed generation model which constrains ATPG based on LFSR functionality. In this paper, the one-pass seed generation model is extended so that it can be applied to SAT-based ATPG, and an LFSR seed generation method using SAT-based ATPG for delay faults is proposed. The effectiveness of the proposed method is evaluated through experiments using the ITC'99 benchmark circuits. The results show that the proposed method achieves complete fault efficiency for random pattern resistant faults. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | SAT-based ATPG / scan based BIST / LFSR / seed generation / delay fault testing |
| Paper # | DC2021-74 |
| Date of Issue | 2022-02-22 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2022/3/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Hiroshi Takahashi(Ehime Univ.) |
| Vice Chair | Tatsuhiro Tsuchiya(Osaka Univ.) |
| Secretary | Tatsuhiro Tsuchiya(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | SAT-based LFSR Seed Generation for Delay Fault BIST |
| Sub Title (in English) | |
| Keyword(1) | SAT-based ATPG |
| Keyword(2) | scan based BIST |
| Keyword(3) | LFSR |
| Keyword(4) | seed generation |
| Keyword(5) | delay fault testing |
| 1st Author's Name | Kotaro Iwamoto |
| 1st Author's Affiliation | Oita University(Oita Univ.) |
| 2nd Author's Name | Satoshi Ohtake |
| 2nd Author's Affiliation | Oita University(Oita Univ.) |
| Date | 2022-03-01 |
| Paper # | DC2021-74 |
| Volume (vol) | vol.121 |
| Number (no) | DC-388 |
| Page | pp.pp.57-62(DC), |
| #Pages | 6 |
| Date of Issue | 2022-02-22 (DC) |