| Presentation | 2022-03-10 A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage Yuya Chida, Toshinori Hosokawa, Koji Yamazaki, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been proposed. Moreover, fault sensitization coverage was proposed as a measure of test quality, and an n-detection test generation method to improve fault sensitization coverage. In the test generation method, test patterns are generated such that target faults are propagated to as many signal lines as possible. The experimental results showed that test sets with high fault sensitization coverage achieved the high fault coverage for various fault models. In the test generation method based on fault sensitization coverage, the path graph for each fault used to select fault propagation paths holds the number of unsensitized path segments from the failure location to the reachable primary outputs. Therefore, there is a problem that the required memory becomes enormous and it is difficult to apply it to large circuits. In this paper, we propose a test generation method based on fault sensitization coverage that can be applied to large circuits by reducing the memory required for the selection of fault propagation paths, and evaluate the test quality and the diagnosis resolution. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | test generation / fault diagnosis / fault sensitization coverage / path segments |
| Paper # | CPSY2021-57,DC2021-91 |
| Date of Issue | 2022-03-03 (CPSY, DC) |
| Conference Information | |
| Committee | CPSY / DC / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC |
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| Conference Date | 2022/3/10(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | ETNET2021 |
| Chair | Michihiro Koibuchi(NII) / Hiroshi Takahashi(Ehime Univ.) / Yuichi Nakamura(NEC) / / Hiroshi Inoue(Kyushu Univ.) |
| Vice Chair | Kota Nakajima(Fujitsu Lab.) / Tomoaki Tsumura(Nagoya Inst. of Tech.) / Tatsuhiro Tsuchiya(Osaka Univ.) |
| Secretary | Kota Nakajima(JAIST) / Tomoaki Tsumura(Hitachi) / Tatsuhiro Tsuchiya(Nihon Univ.) / (Chiba Univ.) / (Tokyo City Univ.) / (Tokyo Inst. of Tech.) |
| Assistant | Ryohei Kobayashi(Tsukuba Univ.) / Takaaki Miyajima(Meiji Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage |
| Sub Title (in English) | |
| Keyword(1) | test generation |
| Keyword(2) | fault diagnosis |
| Keyword(3) | fault sensitization coverage |
| Keyword(4) | path segments |
| 1st Author's Name | Yuya Chida |
| 1st Author's Affiliation | Nihon University.(Nihon Univ.) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon University.(Nihon Univ.) |
| 3rd Author's Name | Koji Yamazaki |
| 3rd Author's Affiliation | Meiji University.(Meiji Univ.) |
| Date | 2022-03-10 |
| Paper # | CPSY2021-57,DC2021-91 |
| Volume (vol) | vol.121 |
| Number (no) | CPSY-425,DC-426 |
| Page | pp.pp.73-78(CPSY), pp.73-78(DC), |
| #Pages | 6 |
| Date of Issue | 2022-03-03 (CPSY, DC) |