| Presentation | 2021-12-08 Measurement of Disturbance Voltage due to Indirect ESD Test on 100BASE-T1 Cable and Its Simulation Evaluation for Communication Failure Masahiro Yoshida, Yusuke Yano, Jianqing Wang, Takeshi Ishida, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the development of automobile driver assistance systems and automatic driving, the practical use of automotive Ethernet (100BASE-T1, 1000BASE-T1) using UTP (Unshield Twisted Pare) cables as a high-speed and high-capacity communication standard has been progressing. In order to ensure the reliability of these automotive Ethernet systems, EMC testing of automotive Ethernet systems is required. In this study, the pulse disturbance applied to these UTP cables by the indirect ESD test is estimated by calculating the common mode current flowing in the UTP cable from the excited electric field and considering the mode conversion at the end of the UTP cable. The threshold value that causes communication failure was derived by introducing the estimated pulse disturbance into the 100BASE-T1 communication simulation. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | vehicle ethernet / 100BASE-T1 / UTP cable / indirect ESD test |
| Paper # | EMCJ2021-57 |
| Date of Issue | 2021-12-01 (EMCJ) |
| Conference Information | |
| Committee | EMCJ / IEE-EMC / IEE-SPC |
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| Conference Date | 2021/12/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Atsuhiro Nishikata(Tokyo Inst. of Tech.) / 石上 忍(東北学院大学) / 伊東 淳一(長岡技術科学大学) |
| Vice Chair | Kimihiro Tajima(NTT-AT) / / 小高 章弘(富士電機) |
| Secretary | Kimihiro Tajima(NAIST) / (Hitachi) / 小高 章弘(鉄道総合技術研究所) |
| Assistant | Kiyoto Matsushima(Hitachi) / Hiroyoshi Shida(EMC Tech.) / Tohlu Matsushima(Kyushu Inst. of Tech.) / 井渕 貴章(大阪大学) / 日下 佳祐(長岡技術科学大学) / 高見 弘(芝浦工業大学) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility / Technical Meeting on Semiconductor Power Converter |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Measurement of Disturbance Voltage due to Indirect ESD Test on 100BASE-T1 Cable and Its Simulation Evaluation for Communication Failure |
| Sub Title (in English) | |
| Keyword(1) | vehicle ethernet |
| Keyword(2) | 100BASE-T1 |
| Keyword(3) | UTP cable |
| Keyword(4) | indirect ESD test |
| Keyword(5) | |
| 1st Author's Name | Masahiro Yoshida |
| 1st Author's Affiliation | Nagoya Institute of Technology(NIT) |
| 2nd Author's Name | Yusuke Yano |
| 2nd Author's Affiliation | Nagoya Institute of Technology(NIT) |
| 3rd Author's Name | Jianqing Wang |
| 3rd Author's Affiliation | Nagoya Institute of Technology(NIT) |
| 4th Author's Name | Takeshi Ishida |
| 4th Author's Affiliation | NOISE LABORATORY CO.,LTD.(NoiseKen) |
| Date | 2021-12-08 |
| Paper # | EMCJ2021-57 |
| Volume (vol) | vol.121 |
| Number (no) | EMCJ-288 |
| Page | pp.pp.16-21(EMCJ), |
| #Pages | 6 |
| Date of Issue | 2021-12-01 (EMCJ) |