| Presentation | 2021-12-10 Characterization of ultra-thin magnetic films using a high sensitivity VNA-FMR spectrometer Shingo Tamaru, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
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| Conference Information | |
| Committee | MRIS / ITE-MMS |
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| Conference Date | 2021/12/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Signal Processing and Others |
| Chair | Shuhei Yoshida(Kinki Univ.) / Kenji Machida(NHK) |
| Vice Chair | |
| Secretary | (Tohoku Inst. of Tech.) / (AIST) |
| Assistant | Yasuaki Nakamura(Ehime Univ.) / Yoshiyuki Hirayama(Samsung) |
| Paper Information | |
| Registration To | Technical Committee on Magnetic Recording & Information Storage / Technical Group on Multi-media Storage |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Characterization of ultra-thin magnetic films using a high sensitivity VNA-FMR spectrometer |
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| 1st Author's Name | Shingo Tamaru |
| 1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
| Date | 2021-12-10 |
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| Volume (vol) | vol.121 |
| Number (no) | MRIS-291 |
| Page | pp.pp.-(), |
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