| Presentation | 2021-11-25 Investigation of defects suppression in Cu halide thin films by emission spectroscopy Chikashi Fujishima, Kunihiko Tanaka, Kaito Watanabe, Naoya Tujimoto, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this study, CuBr1-xIx (CuBrI) thin films, which are transparent p-type semiconductors, were deposited on glass substrates by spin coating method. The samples were characterized by transmission spectra, Electron probe micro analysis (EPMA), X-ray diffraction (XRD) and Photoluminescence (PL). The transmission spectra showed that the transmittance was about 80%. EPMA results showed that the bromine in the film did not increase but the iodine increased. The PL results show that the exciton luminescence is enhanced by immersion in the solution, while the luminescence originating from defects is weakened. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | p-type semiconductor / CuBrI / Photoluminescence / solution penetration method |
| Paper # | ED2021-17,CPM2021-51,LQE2021-29 |
| Date of Issue | 2021-11-18 (ED, CPM, LQE) |
| Conference Information | |
| Committee | ED / CPM / LQE |
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| Conference Date | 2021/11/25(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Hiroki Fujishiro(Tokyo Univ. of Science) / Yuichi Nakamura(Toyohashi Univ. of Tech.) / Toshitada Umezawa(NICT) |
| Vice Chair | Seiya Sakai(Hokkaido Univ.) / Hideki Nakazawa(Hirosaki Univ.) / Junichi Takahara(Osaka Univ.) |
| Secretary | Seiya Sakai(Fjitsu Lab.) / Hideki Nakazawa(NTT) / Junichi Takahara(Ehime Univ.) |
| Assistant | Ryota Isonoi(SCIOCS) / Yoshitugu Yamamoto(Mitsubishi Electric) / Yasuo Kimura(Tokyo Univ. of Tech.) / Fumihiko Hirose(Yamagata Univ.) / Noriko Bamba(Shinshu Univ.) / Shinsuke Tanaka(Fujitsu) / Nobuhiko Nishiyama(Tokyo Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Electron Devices / Technical Committee on Component Parts and Materials / Technical Committee on Lasers and Quantum Electronics |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Investigation of defects suppression in Cu halide thin films by emission spectroscopy |
| Sub Title (in English) | |
| Keyword(1) | p-type semiconductor |
| Keyword(2) | CuBrI |
| Keyword(3) | Photoluminescence |
| Keyword(4) | solution penetration method |
| 1st Author's Name | Chikashi Fujishima |
| 1st Author's Affiliation | Nagaoka University of Technology(Nagaoka Univ Tech) |
| 2nd Author's Name | Kunihiko Tanaka |
| 2nd Author's Affiliation | Nagaoka University of Technology(Nagaoka Univ Tech) |
| 3rd Author's Name | Kaito Watanabe |
| 3rd Author's Affiliation | Nagaoka University of Technology(Nagaoka Univ Tech) |
| 4th Author's Name | Naoya Tujimoto |
| 4th Author's Affiliation | Nagaoka University of Technology(Nagaoka Univ Tech) |
| Date | 2021-11-25 |
| Paper # | ED2021-17,CPM2021-51,LQE2021-29 |
| Volume (vol) | vol.121 |
| Number (no) | ED-259,CPM-260,LQE-261 |
| Page | pp.pp.13-18(ED), pp.13-18(CPM), pp.13-18(LQE), |
| #Pages | 6 |
| Date of Issue | 2021-11-18 (ED, CPM, LQE) |