Presentation 2021-11-18
Distortion Analysis of RF Power Amplifier Using Probability Density of Input Signal and AM-AM Characteristics
Satoshi Tanaka,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) When confirming the ACLR (adjacent channel leakage power ratio), which are representative indicators of distortion in the design of PA (power amplifier), it is well known how to calculate the AM-AM/PM characteristics of PA, input time series data of modulated signals, and analyze the output by Fourier analysis. In 5G (5th generation) mobile phones, not only QPSK (quadrature phase shift keying) modulation but also 16QAM (quadrature modulation), 64QAM, and 256QAM are becoming more multivalued as modulation signals. In addition, the modulation band may exceed 100 MHz, and the amount of time series data increases, and the increase in calculation time becomes a problem. In order to shorten the calculation time, it is considered that calculating the total amount of distortion generated by PA from the probability density of the modulation signal and the AM (amplitude modulation)-AM/PM (phase modulation) characteristics of PA. In this paper, we first focus on the AM-AM characteristics of PA, and compare the Fourier analysis of the IMD3 (inter modulation distortion 3) when two-tone signals are input and those obtained from probability density. As a result, it was confirmed that the two agree well when the nonlinearity is somewhat small.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Mobile Phone / Power Amplifier / Non-Linear / AM-AM / Probability Density / IMD
Paper # CAS2021-43,MSS2021-23
Date of Issue 2021-11-11 (CAS, MSS)

Conference Information
Committee MSS / CAS / IPSJ-AL
Conference Date 2021/11/18(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Atsuo Ozaki(Osaka Inst. of Tech.) / Hiroki Sato(Sony LSI Design)
Vice Chair Shingo Yamaguchi(Yamaguchi Univ.) / Yoshinobu Maeda(Niigata Univ.)
Secretary Shingo Yamaguchi(Hokkaido Univ.) / Yoshinobu Maeda(NEC) / (Sony LSI Design)
Assistant Masato Shirai(Shimane Univ.) / Motoi Yamaguchi(TECHNOPRO) / Yohei Nakamura(Hitachi) / Takahide Sato(Univ. of Yamanashi) / Yasutoshi Aibara(Murata Manufacturing)

Paper Information
Registration To Technical Committee on Mathematical Systems Science and its Applications / Technical Committee on Circuits and Systems / Special Interest Group on Algorithms
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Distortion Analysis of RF Power Amplifier Using Probability Density of Input Signal and AM-AM Characteristics
Sub Title (in English)
Keyword(1) Mobile Phone
Keyword(2) Power Amplifier
Keyword(3) Non-Linear
Keyword(4) AM-AM
Keyword(5) Probability Density
Keyword(6) IMD
1st Author's Name Satoshi Tanaka
1st Author's Affiliation Murata Manufacturing Co. Ltd.(Murata Manufacturing)
Date 2021-11-18
Paper # CAS2021-43,MSS2021-23
Volume (vol) vol.121
Number (no) CAS-249,MSS-250
Page pp.pp.34-39(CAS), pp.34-39(MSS),
#Pages 6
Date of Issue 2021-11-11 (CAS, MSS)