Presentation | 2021-11-18 Distortion Analysis of RF Power Amplifier Using Probability Density of Input Signal and AM-AM Characteristics Satoshi Tanaka, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | When confirming the ACLR (adjacent channel leakage power ratio), which are representative indicators of distortion in the design of PA (power amplifier), it is well known how to calculate the AM-AM/PM characteristics of PA, input time series data of modulated signals, and analyze the output by Fourier analysis. In 5G (5th generation) mobile phones, not only QPSK (quadrature phase shift keying) modulation but also 16QAM (quadrature modulation), 64QAM, and 256QAM are becoming more multivalued as modulation signals. In addition, the modulation band may exceed 100 MHz, and the amount of time series data increases, and the increase in calculation time becomes a problem. In order to shorten the calculation time, it is considered that calculating the total amount of distortion generated by PA from the probability density of the modulation signal and the AM (amplitude modulation)-AM/PM (phase modulation) characteristics of PA. In this paper, we first focus on the AM-AM characteristics of PA, and compare the Fourier analysis of the IMD3 (inter modulation distortion 3) when two-tone signals are input and those obtained from probability density. As a result, it was confirmed that the two agree well when the nonlinearity is somewhat small. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Mobile Phone / Power Amplifier / Non-Linear / AM-AM / Probability Density / IMD |
Paper # | CAS2021-43,MSS2021-23 |
Date of Issue | 2021-11-11 (CAS, MSS) |
Conference Information | |
Committee | MSS / CAS / IPSJ-AL |
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Conference Date | 2021/11/18(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Atsuo Ozaki(Osaka Inst. of Tech.) / Hiroki Sato(Sony LSI Design) |
Vice Chair | Shingo Yamaguchi(Yamaguchi Univ.) / Yoshinobu Maeda(Niigata Univ.) |
Secretary | Shingo Yamaguchi(Hokkaido Univ.) / Yoshinobu Maeda(NEC) / (Sony LSI Design) |
Assistant | Masato Shirai(Shimane Univ.) / Motoi Yamaguchi(TECHNOPRO) / Yohei Nakamura(Hitachi) / Takahide Sato(Univ. of Yamanashi) / Yasutoshi Aibara(Murata Manufacturing) |
Paper Information | |
Registration To | Technical Committee on Mathematical Systems Science and its Applications / Technical Committee on Circuits and Systems / Special Interest Group on Algorithms |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Distortion Analysis of RF Power Amplifier Using Probability Density of Input Signal and AM-AM Characteristics |
Sub Title (in English) | |
Keyword(1) | Mobile Phone |
Keyword(2) | Power Amplifier |
Keyword(3) | Non-Linear |
Keyword(4) | AM-AM |
Keyword(5) | Probability Density |
Keyword(6) | IMD |
1st Author's Name | Satoshi Tanaka |
1st Author's Affiliation | Murata Manufacturing Co. Ltd.(Murata Manufacturing) |
Date | 2021-11-18 |
Paper # | CAS2021-43,MSS2021-23 |
Volume (vol) | vol.121 |
Number (no) | CAS-249,MSS-250 |
Page | pp.pp.34-39(CAS), pp.34-39(MSS), |
#Pages | 6 |
Date of Issue | 2021-11-11 (CAS, MSS) |