| Presentation | 2021-11-30 Queueing simulation of faults correction based on software reliability growth models Yuka Minamino, Shinji Inoue, Shigeru Yamada, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | R2021-37 |
| Date of Issue | 2021-11-23 (R) |
| Conference Information | |
| Committee | R |
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| Conference Date | 2021/11/30(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Reliability of semiconductor and electronic devices, Reliability ge |
| Chair | Tadashi Dohi(Hiroshima Univ.) |
| Vice Chair | Yasushi Kadota(Ricoh) |
| Secretary | Yasushi Kadota(Hiroshima Univ.) |
| Assistant | Shinji Yokogawa(Univ. of Electro-Comm.) / Takahide Yoshikawa(Fujitsu Lab.) / Takenori Sakumura(Housei Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Reliability |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Queueing simulation of faults correction based on software reliability growth models |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Yuka Minamino |
| 1st Author's Affiliation | Tottori University(Tottori Univ.) |
| 2nd Author's Name | Shinji Inoue |
| 2nd Author's Affiliation | Kansai University(Kansai Univ.) |
| 3rd Author's Name | Shigeru Yamada |
| 3rd Author's Affiliation | Tottori University(Tottori Univ.) |
| Date | 2021-11-30 |
| Paper # | R2021-37 |
| Volume (vol) | vol.121 |
| Number (no) | R-276 |
| Page | pp.pp.19-23(R), |
| #Pages | 5 |
| Date of Issue | 2021-11-23 (R) |