Presentation 2021-12-02
Mask Optimization Method Using Simulated Quantum Annealing
Yukihide Kohira, Haruki Nakayama, Naoki Nonaka, Tomomi Matsui, Atsushi Takahashi, Chikaaki Kodama,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) To realize continuously scaling down of technology node, progressing manufacturing process by optical lithography is required. In resolution enhancement techniques in the optical lithography, Optical Proximity Correction (OPC), which improves shape fidelity of formed patterns on wafers to designed target patterns by mask optimization, is essential. It is known that the mask optimization can be formulated as 0-1 Quadratic Programming problem (0-1 QP). Recently, Quantum Annealing, which solves 0-1 QP in a short computation time, has attracted attention. In this paper, we examine a method using Simulated Quantum Annealing (SQA) for the mask optimization problem to obtain a mask with high fidelity to target patterns as well as high tolerance to process variation. In experiments, we evaluate the method using SQA and existing methods in fidelity to target patterns, tolerance to process variation, and execution time.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) optical lithography / mask optimization / Optical Proximity Correction (OPC) / Simulated Quantum Annealing
Paper # VLD2021-45,ICD2021-55,DC2021-51,RECONF2021-53
Date of Issue 2021-11-24 (VLD, ICD, DC, RECONF)

Conference Information
Committee VLD / DC / RECONF / ICD / IPSJ-SLDM
Conference Date 2021/12/1(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Design Gaia 2021 -New Field of VLSI Design-
Chair Kazutoshi Kobayashi(Kyoto Inst. of Tech.) / Hiroshi Takahashi(Ehime Univ.) / Kentaro Sano(RIKEN) / Masafumi Takahashi(Kioxia) / Yuichi Nakamura(NEC)
Vice Chair Minako Ikeda(NTT) / Tatsuhiro Tsuchiya(Osaka Univ.) / Yoshiki Yamaguchi(Tsukuba Univ.) / Tomonori Izumi(Ritsumeikan Univ.) / Makoto Ikeda(Univ. of Tokyo)
Secretary Minako Ikeda(Osaka Univ.) / Tatsuhiro Tsuchiya(NEC) / Yoshiki Yamaguchi(Nihon Univ.) / Tomonori Izumi(Chiba Univ.) / Makoto Ikeda(NEC) / (Tokyo Inst. of Tech.)
Assistant / / Yukitaka Takemura(INTEL) / Yasunori Osana(Ryukyu Univ.) / Kosuke Miyaji(Shinshu Univ.) / Yoshiaki Yoshihara(キオクシア) / Takeshi Kuboki(Kyushu Univ.)

Paper Information
Registration To Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Special Interest Group on System and LSI Design Methodology
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Mask Optimization Method Using Simulated Quantum Annealing
Sub Title (in English)
Keyword(1) optical lithography
Keyword(2) mask optimization
Keyword(3) Optical Proximity Correction (OPC)
Keyword(4) Simulated Quantum Annealing
1st Author's Name Yukihide Kohira
1st Author's Affiliation The University of Aizu(Univ. of Aizu)
2nd Author's Name Haruki Nakayama
2nd Author's Affiliation The University of Aizu(Univ. of Aizu)
3rd Author's Name Naoki Nonaka
3rd Author's Affiliation The University of Aizu(Univ. of Aizu)
4th Author's Name Tomomi Matsui
4th Author's Affiliation Tokyo Institute of Technology(Tokyo Tech)
5th Author's Name Atsushi Takahashi
5th Author's Affiliation Tokyo Institute of Technology(Tokyo Tech)
6th Author's Name Chikaaki Kodama
6th Author's Affiliation KIOXIA Corporation(KIOXIA Corporation)
Date 2021-12-02
Paper # VLD2021-45,ICD2021-55,DC2021-51,RECONF2021-53
Volume (vol) vol.121
Number (no) VLD-277,ICD-278,DC-279,RECONF-280
Page pp.pp.162-167(VLD), pp.162-167(ICD), pp.162-167(DC), pp.162-167(RECONF),
#Pages 6
Date of Issue 2021-11-24 (VLD, ICD, DC, RECONF)