| Presentation | 2021-10-21 Statistical analysis of RTN behavior on transistor structure, operating region, and carrier transport direction Ryo Akimoto, Rihito Kuroda, Takezo Mawaki, Shigotoshi Sugawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | SDM2021-52 |
| Date of Issue | 2021-10-14 (SDM) |
| Conference Information | |
| Committee | SDM |
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| Conference Date | 2021/10/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Process Science and New Process Technology |
| Chair | Hiroshige Hirano(TowerPartners Semiconductor) |
| Vice Chair | Shunichiro Ohmi(Tokyo Inst. of Tech.) |
| Secretary | Shunichiro Ohmi(AIST) |
| Assistant | Taiji Noda(Panasonic) / Tomoyuki Suwa(Tohoku Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Silicon Device and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Statistical analysis of RTN behavior on transistor structure, operating region, and carrier transport direction |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Ryo Akimoto |
| 1st Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 2nd Author's Name | Rihito Kuroda |
| 2nd Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 3rd Author's Name | Takezo Mawaki |
| 3rd Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 4th Author's Name | Shigotoshi Sugawa |
| 4th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| Date | 2021-10-21 |
| Paper # | SDM2021-52 |
| Volume (vol) | vol.121 |
| Number (no) | SDM-212 |
| Page | pp.pp.27-32(SDM), |
| #Pages | 6 |
| Date of Issue | 2021-10-14 (SDM) |