Presentation 2021-10-19
Robustness Improvement by XORing Multiple Entropy Sources for True Random Number Generator
Ruilin Zhang, Hirofumi Shinohara,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # HWS2021-45,ICD2021-19
Date of Issue 2021-10-12 (HWS, ICD)

Conference Information
Committee HWS / ICD
Conference Date 2021/10/19(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Hardware Security, etc.
Chair Yasuhisa Shimazaki(Renesas Electronics) / Masafumi Takahashi(Kioxia)
Vice Chair Makoto Nagata(Kobe Univ.) / Daisuke Suzuki(Mitsubishi Electric) / Makoto Ikeda(Univ. of Tokyo)
Secretary Makoto Nagata(NTT) / Daisuke Suzuki(NAIST) / Makoto Ikeda(Osaka Univ.)
Assistant / Kosuke Miyaji(Shinshu Univ.) / Yoshiaki Yoshihara(キオクシア) / Takeshi Kuboki(Kyushu Univ.)

Paper Information
Registration To Technical Committee on Hardware Security / Technical Committee on Integrated Circuits and Devices
Language ENG-JTITLE
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Robustness Improvement by XORing Multiple Entropy Sources for True Random Number Generator
Sub Title (in English) Stochastic Calculations of Mismatch-to-Noise Ratio
Keyword(1)
1st Author's Name Ruilin Zhang
1st Author's Affiliation Waseda University(Waseda Univ.)
2nd Author's Name Hirofumi Shinohara
2nd Author's Affiliation Waseda University(Waseda Univ.)
Date 2021-10-19
Paper # HWS2021-45,ICD2021-19
Volume (vol) vol.121
Number (no) HWS-206,ICD-207
Page pp.pp.23-25(HWS), pp.23-25(ICD),
#Pages 3
Date of Issue 2021-10-12 (HWS, ICD)