Presentation | 2021-10-07 VNA calibration stability in on-wafer measurement in millimeter-wave band Kohei Fujiwara, Takashi Kondo, Shinji Hara, Noriyuki Tanba, Eiji Suematsu, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | EMCJ2021-28,MW2021-40,EST2021-30 |
Date of Issue | 2021-09-30 (EMCJ, MW, EST) |
Conference Information | |
Committee | EST / MW / EMCJ / IEE-EMC |
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Conference Date | 2021/10/7(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Jun Shibayama(Hosei Univ.) / Noriharu Suematsu(Tohoku Univ.) / Atsuhiro Nishikata(Tokyo Inst. of Tech.) |
Vice Chair | Masayuki Kimishima(Advantest) / Yasuhide Tsuji(Muroran Inst. of Tech.) / Yasuo Ohtera(Toyama Prefectural Univ.) / Tadashi Kawai(Univ. of Hyogo) / Kensuke Okubo(Okayama Prefectural Univ.) / Hideyuki Nakamizo(Mitsubishi Electric) / Kimihiro Tajima(NTT-AT) |
Secretary | Masayuki Kimishima(ENRI) / Yasuhide Tsuji(yoto Univ.) / Yasuo Ohtera(Saitama Univ.) / Tadashi Kawai(Toshiba) / Kensuke Okubo(NAIST) / Hideyuki Nakamizo(Hitachi) / Kimihiro Tajima |
Assistant | Seiya Kishimoto(Nihon Univ.) / Akito Iguchi(Muroran Inst. of Tech) / Naoki Hasegawa(Softbank) / Kosuke Katayama(Waseda Univ.) / Kiyoto Matsushima(Hitachi) / Hiroyoshi Shida(EMC Tech.) / Tohlu Matsushima(Kyushu Inst. of Tech.) |
Paper Information | |
Registration To | Technical Committee on Electronics Simulation Technology / Technical Committee on Microwaves / Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | VNA calibration stability in on-wafer measurement in millimeter-wave band |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Kohei Fujiwara |
1st Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute(TIRI) |
2nd Author's Name | Takashi Kondo |
2nd Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute(TIRI) |
3rd Author's Name | Shinji Hara |
3rd Author's Affiliation | Nagoya University(Nagoya University) |
4th Author's Name | Noriyuki Tanba |
4th Author's Affiliation | Nagoya University(Nagoya University) |
5th Author's Name | Eiji Suematsu |
5th Author's Affiliation | Nagoya University(Nagoya University) |
Date | 2021-10-07 |
Paper # | EMCJ2021-28,MW2021-40,EST2021-30 |
Volume (vol) | vol.121 |
Number (no) | EMCJ-186,MW-187,EST-188 |
Page | pp.pp.6-10(EMCJ), pp.6-10(MW), pp.6-10(EST), |
#Pages | 5 |
Date of Issue | 2021-09-30 (EMCJ, MW, EST) |