Presentation 2021-10-07
Research on technology for predicting the causes and locations of system abnormalities
Hiroki Nishida, Ryuji Sanuki, Nanako Yoshimura, Hideaki Kimura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In recent years, the shortage of engineers has become a problem due to the declining birthrate and aging population. In this paper, we propose a system for identifying failure locations and factors using reverse engineering technology. The proposed system constructs an object to be evaluated on a computer and identifies anomalies and causes of anomalies by linking artificial intelligence (AI) technology and numerical calculation technology. To verify the validity of the proposed system, numerical calculations and evaluation experiments were conducted in a one-dimensional space, and the results are reported.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Anomaly location / system coordination / finite difference time domain method / machine learning
Paper # EMCJ2021-31,MW2021-43,EST2021-33
Date of Issue 2021-09-30 (EMCJ, MW, EST)

Conference Information
Committee EST / MW / EMCJ / IEE-EMC
Conference Date 2021/10/7(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Jun Shibayama(Hosei Univ.) / Noriharu Suematsu(Tohoku Univ.) / Atsuhiro Nishikata(Tokyo Inst. of Tech.)
Vice Chair Masayuki Kimishima(Advantest) / Yasuhide Tsuji(Muroran Inst. of Tech.) / Yasuo Ohtera(Toyama Prefectural Univ.) / Tadashi Kawai(Univ. of Hyogo) / Kensuke Okubo(Okayama Prefectural Univ.) / Hideyuki Nakamizo(Mitsubishi Electric) / Kimihiro Tajima(NTT-AT)
Secretary Masayuki Kimishima(ENRI) / Yasuhide Tsuji(yoto Univ.) / Yasuo Ohtera(Saitama Univ.) / Tadashi Kawai(Toshiba) / Kensuke Okubo(NAIST) / Hideyuki Nakamizo(Hitachi) / Kimihiro Tajima
Assistant Seiya Kishimoto(Nihon Univ.) / Akito Iguchi(Muroran Inst. of Tech) / Naoki Hasegawa(Softbank) / Kosuke Katayama(Waseda Univ.) / Kiyoto Matsushima(Hitachi) / Hiroyoshi Shida(EMC Tech.) / Tohlu Matsushima(Kyushu Inst. of Tech.)

Paper Information
Registration To Technical Committee on Electronics Simulation Technology / Technical Committee on Microwaves / Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Research on technology for predicting the causes and locations of system abnormalities
Sub Title (in English)
Keyword(1) Anomaly location
Keyword(2) system coordination
Keyword(3) finite difference time domain method
Keyword(4) machine learning
1st Author's Name Hiroki Nishida
1st Author's Affiliation Chubu University(Chubu Univ.)
2nd Author's Name Ryuji Sanuki
2nd Author's Affiliation Chubu University(Chubu Univ.)
3rd Author's Name Nanako Yoshimura
3rd Author's Affiliation Chubu University(Chubu Univ.)
4th Author's Name Hideaki Kimura
4th Author's Affiliation Chubu University(Chubu Univ.)
Date 2021-10-07
Paper # EMCJ2021-31,MW2021-43,EST2021-33
Volume (vol) vol.121
Number (no) EMCJ-186,MW-187,EST-188
Page pp.pp.21-24(EMCJ), pp.21-24(MW), pp.21-24(EST),
#Pages 4
Date of Issue 2021-09-30 (EMCJ, MW, EST)