| Presentation | 2021-10-07 FDTD Analysis of the Microwave Measurement System with Optically Modulated Scatterer Takahiro Kurosawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Microwave electric field measurement system based on the modulated scattering technique with optically modulated semiconductor scatterer is analyzed by using FDTD method. The sensitivity and invasiveness are calculated from the modulation amplitude of forward scattering field with resistivity modulation of the disk scatterer and calculated from total cross section of it, respectively. Increasing the resistivity modulation amplitude and decrease the thickness of the scatterer is effective for increasing the sensitivity. Increasing the diameter of scatterer also increase the sensitivity while it increases the invasiveness. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electric field measurement / modulated scattering / FDTD / EMC |
| Paper # | EMCJ2021-34,MW2021-46,EST2021-36 |
| Date of Issue | 2021-09-30 (EMCJ, MW, EST) |
| Conference Information | |
| Committee | EST / MW / EMCJ / IEE-EMC |
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| Conference Date | 2021/10/7(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Jun Shibayama(Hosei Univ.) / Noriharu Suematsu(Tohoku Univ.) / Atsuhiro Nishikata(Tokyo Inst. of Tech.) |
| Vice Chair | Masayuki Kimishima(Advantest) / Yasuhide Tsuji(Muroran Inst. of Tech.) / Yasuo Ohtera(Toyama Prefectural Univ.) / Tadashi Kawai(Univ. of Hyogo) / Kensuke Okubo(Okayama Prefectural Univ.) / Hideyuki Nakamizo(Mitsubishi Electric) / Kimihiro Tajima(NTT-AT) |
| Secretary | Masayuki Kimishima(ENRI) / Yasuhide Tsuji(yoto Univ.) / Yasuo Ohtera(Saitama Univ.) / Tadashi Kawai(Toshiba) / Kensuke Okubo(NAIST) / Hideyuki Nakamizo(Hitachi) / Kimihiro Tajima |
| Assistant | Seiya Kishimoto(Nihon Univ.) / Akito Iguchi(Muroran Inst. of Tech) / Naoki Hasegawa(Softbank) / Kosuke Katayama(Waseda Univ.) / Kiyoto Matsushima(Hitachi) / Hiroyoshi Shida(EMC Tech.) / Tohlu Matsushima(Kyushu Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Electronics Simulation Technology / Technical Committee on Microwaves / Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | FDTD Analysis of the Microwave Measurement System with Optically Modulated Scatterer |
| Sub Title (in English) | |
| Keyword(1) | electric field measurement |
| Keyword(2) | modulated scattering |
| Keyword(3) | FDTD |
| Keyword(4) | EMC |
| 1st Author's Name | Takahiro Kurosawa |
| 1st Author's Affiliation | AKITA Industrial Technology Center(Akita ITC) |
| Date | 2021-10-07 |
| Paper # | EMCJ2021-34,MW2021-46,EST2021-36 |
| Volume (vol) | vol.121 |
| Number (no) | EMCJ-186,MW-187,EST-188 |
| Page | pp.pp.35-39(EMCJ), pp.35-39(MW), pp.35-39(EST), |
| #Pages | 5 |
| Date of Issue | 2021-09-30 (EMCJ, MW, EST) |