Presentation | 2021-07-02 Prototyping of Three-Element Operational Probes for Vector EM-fields' Transversal Component Measurement Atsuhiro Nishikata, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | EMCJ2021-25 |
Date of Issue | 2021-06-25 (EMCJ) |
Conference Information | |
Committee | EMCJ / EMD / WPT |
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Conference Date | 2021/7/2(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Yoshiki Kayano(Univ. of Electro-Comm.) / Toshio Ishizaki(Ryukoku Univ.) |
Vice Chair | Kimihiro Tajima(NTT-AT) |
Secretary | Kimihiro Tajima(NAIST) / (Hitachi) / (Nippon Inst. of Tech.) |
Assistant | Kiyoto Matsushima(Hitachi) / Hiroyoshi Shida(EMC Tech.) / Toru Matsushima(Kyushu Inst. of Tech.) / Yuichi Hayashi(NAIST) / Kazuaki Miyanaga(Fujitsu Component) / Yoshiaki Narusue(Univ. of Tokyo) / Yuki Tanaka(Panasonic) |
Paper Information | |
Registration To | Technical Committee on Electromagnetic Compatibility / Technical Committee on Electromechanical Devices / Technical Committee on Wireless Power Transfer |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Prototyping of Three-Element Operational Probes for Vector EM-fields' Transversal Component Measurement |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Atsuhiro Nishikata |
1st Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
Date | 2021-07-02 |
Paper # | EMCJ2021-25 |
Volume (vol) | vol.121 |
Number (no) | EMCJ-83 |
Page | pp.pp.1-6(EMCJ), |
#Pages | 6 |
Date of Issue | 2021-06-25 (EMCJ) |