Presentation 2021-07-02
Prototyping of Three-Element Operational Probes for Vector EM-fields' Transversal Component Measurement
Atsuhiro Nishikata,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # EMCJ2021-25
Date of Issue 2021-06-25 (EMCJ)

Conference Information
Committee EMCJ / EMD / WPT
Conference Date 2021/7/2(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
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Topics (in English)
Chair Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Yoshiki Kayano(Univ. of Electro-Comm.) / Toshio Ishizaki(Ryukoku Univ.)
Vice Chair Kimihiro Tajima(NTT-AT)
Secretary Kimihiro Tajima(NAIST) / (Hitachi) / (Nippon Inst. of Tech.)
Assistant Kiyoto Matsushima(Hitachi) / Hiroyoshi Shida(EMC Tech.) / Toru Matsushima(Kyushu Inst. of Tech.) / Yuichi Hayashi(NAIST) / Kazuaki Miyanaga(Fujitsu Component) / Yoshiaki Narusue(Univ. of Tokyo) / Yuki Tanaka(Panasonic)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility / Technical Committee on Electromechanical Devices / Technical Committee on Wireless Power Transfer
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Prototyping of Three-Element Operational Probes for Vector EM-fields' Transversal Component Measurement
Sub Title (in English)
Keyword(1)
1st Author's Name Atsuhiro Nishikata
1st Author's Affiliation Tokyo Institute of Technology(Tokyo Tech)
Date 2021-07-02
Paper # EMCJ2021-25
Volume (vol) vol.121
Number (no) EMCJ-83
Page pp.pp.1-6(EMCJ),
#Pages 6
Date of Issue 2021-06-25 (EMCJ)