Presentation 2021-07-20
Evaluation of TRNG Using CMOS Image Sensor
Hayato Tatsuno, Tatsuya Oyama, Masayoshi Shirahata, Shunsuke Okura, Takeshi Fujino,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Recently, the number of IoT devices has been increasing rapidly, and cryptographic functions such as authentication, key exchange, and encryption are required for secure communication between other communication devices. True random number generator (TRNG) which generate ephemeral key and/or nonce are required to realize these functions. TRNG are required to have the properties of randomness, unpredictability, and non-repeatability. In this paper, we evaluated CIS-TRNG as a physically generated TRNG which utilize the thermal noise on each pixel among CMOS Image Sensor (CIS). We slightly modify the normal readout sequence of CIS image, and CIS-TRNG reads out the signal containing thermal noise twice during the signal from photodiode is cut off. CIS-TRNG generates random number from the least significant bit of the difference between the two pixel readout voltages. We estimated the performance of CIS-TRNG using SP800-90B provided by NIST.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) CMOS Image Sensor / true random number generator / TRNG / SP800-90B
Paper # ISEC2021-26,SITE2021-20,BioX2021-27,HWS2021-26,ICSS2021-31,EMM2021-31
Date of Issue 2021-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM)

Conference Information
Committee BioX / ISEC / SITE / ICSS / EMM / HWS / IPSJ-CSEC / IPSJ-SPT
Conference Date 2021/7/19(2days)
Place (in Japanese) (See Japanese page)
Place (in English) online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hitoshi Imaoka(NEC) / Tetsuya Izu(Fujitsu Labs.) / Masaru Ogawa(Kobe Gakuin Univ.) / Katsunari Yoshioka(Yokohama National Univ.) / Ryoichi Nishimura(NICT) / Yasuhisa Shimazaki(Renesas Electronics)
Vice Chair Masatsugu Ichino(Univ. of Electro-Comm.) / Naoyuki Takada(SECOM) / Noboru Kunihiro(Tsukuba Univ.) / Goichiro Hanaoka(AIST) / Takushi Otani(Kibi International Univ.) / Takeo Tatsumi(Open Univ. of Japan) / Kazunori Kamiya(NTT) / Takahiro Kasama(NICT) / Masaaki Fujiyoshi(Tokyo Metropolitan Univ.) / Masatsugu Ichino(Univ. of Electro-Comm.) / Makoto Nagata(Kobe Univ.) / Daisuke Suzuki(Mitsubishi Electric)
Secretary Masatsugu Ichino(KDDI Research) / Naoyuki Takada(MitsubishiElectric) / Noboru Kunihiro(Fujitsu Labs.) / Goichiro Hanaoka(Ibaraki Univ.) / Takushi Otani(Yamaguchi Pref Univ.) / Takeo Tatsumi(Hokuriku Univ.) / Kazunori Kamiya(KDDI labs.) / Takahiro Kasama(Okayama Univ.) / Masaaki Fujiyoshi(Utsunomiya Univ.) / Masatsugu Ichino(NICT) / Makoto Nagata(NTT) / Daisuke Suzuki(NAIST)
Assistant Hiroyuki Suzuki(Gunma Univ) / Akihiro Hayasaka(NEC) / Takahiro Matsuda(AIST) / Hideyuki Fujii(NRI-Secure) / Yusuke Tachibana(Fukuoka Inst. of Tech.) / Keisuke Kito(Mitsubishi Electric) / Takeshi Sugawara(Univ. of Electro-Comm.) / Shoko Imaizumi(Chiba Univ.) / Youichi Takashima(Kaishi Professional Univ.)

Paper Information
Registration To Technical Committee on Biometrics / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Enriched MultiMedia / Technical Committee on Hardware Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of TRNG Using CMOS Image Sensor
Sub Title (in English)
Keyword(1) CMOS Image Sensor
Keyword(2) true random number generator
Keyword(3) TRNG
Keyword(4) SP800-90B
1st Author's Name Hayato Tatsuno
1st Author's Affiliation Ritsumeikan University(Ritsumeikan Univ.)
2nd Author's Name Tatsuya Oyama
2nd Author's Affiliation Ritsumeikan University(Ritsumeikan Univ.)
3rd Author's Name Masayoshi Shirahata
3rd Author's Affiliation Ritsumeikan University(Ritsumeikan Univ.)
4th Author's Name Shunsuke Okura
4th Author's Affiliation Ritsumeikan University(Ritsumeikan Univ.)
5th Author's Name Takeshi Fujino
5th Author's Affiliation Ritsumeikan University(Ritsumeikan Univ.)
Date 2021-07-20
Paper # ISEC2021-26,SITE2021-20,BioX2021-27,HWS2021-26,ICSS2021-31,EMM2021-31
Volume (vol) vol.121
Number (no) ISEC-118,SITE-119,BioX-120,HWS-121,ICSS-122,EMM-123
Page pp.pp.98-103(ISEC), pp.98-103(SITE), pp.98-103(BioX), pp.98-103(HWS), pp.98-103(ICSS), pp.98-103(EMM),
#Pages 6
Date of Issue 2021-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM)