| Presentation | 2021-07-20 Implimentation of RISC-V TEE using PUF as Root of Trust Kota Yoshida, Kuniyasu Suzaki, Takeshi Fujino, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In society 5.0, acquiring trustworthy data from a huge amount of IoT devices in physical spaces, it is important to verify the authenticity of IoT devices and software. It is achieved by TEE, root of trust, and remote attestation. TEE is an isolated execution environment to execute critical software such as cryptographic processes and handling secret keys. The root of trust provides a device-specific key and the remote attestation provides means for third parties to verify the authenticity of the device and software. RISC-V Keystone is an open framework to implement TEE on RISC-V ISA. Keystone provides TEE and remote attestation framework, however root of trust have to be additionally implemented. In this paper, we introduce an implementation that uses PUF as a root of trust in RISC-V Keystone. It is not necessary to deploy a secret key into a secure non-volatile memory by using PUF as a secure key generator, so high security can be realized at a low cost. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | RISC-V / Trusted Execution Environmnet / Hardware Root of Trust / Physically Unclonable Function |
| Paper # | ISEC2021-25,SITE2021-19,BioX2021-26,HWS2021-25,ICSS2021-30,EMM2021-30 |
| Date of Issue | 2021-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM) |
| Conference Information | |
| Committee | BioX / ISEC / SITE / ICSS / EMM / HWS / IPSJ-CSEC / IPSJ-SPT |
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| Conference Date | 2021/7/19(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Hitoshi Imaoka(NEC) / Tetsuya Izu(Fujitsu Labs.) / Masaru Ogawa(Kobe Gakuin Univ.) / Katsunari Yoshioka(Yokohama National Univ.) / Ryoichi Nishimura(NICT) / Yasuhisa Shimazaki(Renesas Electronics) |
| Vice Chair | Masatsugu Ichino(Univ. of Electro-Comm.) / Naoyuki Takada(SECOM) / Noboru Kunihiro(Tsukuba Univ.) / Goichiro Hanaoka(AIST) / Takushi Otani(Kibi International Univ.) / Takeo Tatsumi(Open Univ. of Japan) / Kazunori Kamiya(NTT) / Takahiro Kasama(NICT) / Masaaki Fujiyoshi(Tokyo Metropolitan Univ.) / Masatsugu Ichino(Univ. of Electro-Comm.) / Makoto Nagata(Kobe Univ.) / Daisuke Suzuki(Mitsubishi Electric) |
| Secretary | Masatsugu Ichino(KDDI Research) / Naoyuki Takada(MitsubishiElectric) / Noboru Kunihiro(Fujitsu Labs.) / Goichiro Hanaoka(Ibaraki Univ.) / Takushi Otani(Yamaguchi Pref Univ.) / Takeo Tatsumi(Hokuriku Univ.) / Kazunori Kamiya(KDDI labs.) / Takahiro Kasama(Okayama Univ.) / Masaaki Fujiyoshi(Utsunomiya Univ.) / Masatsugu Ichino(NICT) / Makoto Nagata(NTT) / Daisuke Suzuki(NAIST) |
| Assistant | Hiroyuki Suzuki(Gunma Univ) / Akihiro Hayasaka(NEC) / Takahiro Matsuda(AIST) / Hideyuki Fujii(NRI-Secure) / Yusuke Tachibana(Fukuoka Inst. of Tech.) / Keisuke Kito(Mitsubishi Electric) / Takeshi Sugawara(Univ. of Electro-Comm.) / Shoko Imaizumi(Chiba Univ.) / Youichi Takashima(Kaishi Professional Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Biometrics / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Enriched MultiMedia / Technical Committee on Hardware Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Implimentation of RISC-V TEE using PUF as Root of Trust |
| Sub Title (in English) | |
| Keyword(1) | RISC-V |
| Keyword(2) | Trusted Execution Environmnet |
| Keyword(3) | Hardware Root of Trust |
| Keyword(4) | Physically Unclonable Function |
| 1st Author's Name | Kota Yoshida |
| 1st Author's Affiliation | Ritsumeikan University(Ritsumeikan Univ.) |
| 2nd Author's Name | Kuniyasu Suzaki |
| 2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
| 3rd Author's Name | Takeshi Fujino |
| 3rd Author's Affiliation | Ritsumeikan University(Ritsumeikan Univ.) |
| Date | 2021-07-20 |
| Paper # | ISEC2021-25,SITE2021-19,BioX2021-26,HWS2021-25,ICSS2021-30,EMM2021-30 |
| Volume (vol) | vol.121 |
| Number (no) | ISEC-118,SITE-119,BioX-120,HWS-121,ICSS-122,EMM-123 |
| Page | pp.pp.92-97(ISEC), pp.92-97(SITE), pp.92-97(BioX), pp.92-97(HWS), pp.92-97(ICSS), pp.92-97(EMM), |
| #Pages | 6 |
| Date of Issue | 2021-07-12 (ISEC, SITE, BioX, HWS, ICSS, EMM) |