Presentation 2021-04-12
Fundamental Study on Evaluating Frequency Injection Attack Resistance against RO-based TRNGs
Riki Hashimoto, Daisuke Fujimoto, Yuichi Hayashi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Frequency injection attacks have been reported as an attack to degrade the randomness of ring oscillator (RO)-based true random number generators (TRNGs). In previous studies, it has been reported that the randomness of RO-based TRNGs can be degraded at multiple injection frequencies, but the relationship between the oscillation frequency of the RO and the effective injection frequency for the attack is not clear. In this paper, we developed a system in which the relationship between injection frequency and randomness degradation in RO-based TRNGs can be evaluated and show resistance of TRNGs with 3-stage and 5-stage ROs against frequency injection attacks.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) TRNG / Ring Oscillator / Frequency Injection Attack
Paper # HWS2021-9
Date of Issue 2021-04-05 (HWS)

Conference Information
Committee HWS
Conference Date 2021/4/12(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Tokyo University/Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Hardware Security
Chair Makoto Ikeda(Univ. of Tokyo)
Vice Chair Yasuhisa Shimazaki(Renesas Electronics) / Makoto Nagata(Kobe Univ.)
Secretary Yasuhisa Shimazaki(Kyushu Univ.) / Makoto Nagata(NTT)
Assistant

Paper Information
Registration To Technical Committee on Hardware Security
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fundamental Study on Evaluating Frequency Injection Attack Resistance against RO-based TRNGs
Sub Title (in English)
Keyword(1) TRNG
Keyword(2) Ring Oscillator
Keyword(3) Frequency Injection Attack
1st Author's Name Riki Hashimoto
1st Author's Affiliation Nara Institute of Science and Technology(NAIST)
2nd Author's Name Daisuke Fujimoto
2nd Author's Affiliation Nara Institute of Science and Technology(NAIST)
3rd Author's Name Yuichi Hayashi
3rd Author's Affiliation Nara Institute of Science and Technology(NAIST)
Date 2021-04-12
Paper # HWS2021-9
Volume (vol) vol.121
Number (no) HWS-1
Page pp.pp.39-42(HWS),
#Pages 4
Date of Issue 2021-04-05 (HWS)