Presentation 2021-03-26
Unsupervised Recycled FPGA Detection Using Direct Density Ratio Estimation Based on Self-referencing
Yuya Isaka, Michihiro Shintani, Foisal Ahmed, Michiko Inoue,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) It is well known that the performance of field-programmable gate-array (FPGA) degrades over time due to their usage. Several methods have been proposed in which the frequency of a ring oscillator (Ring oscillator, RO) designed on an FPGA is analyzed and whether it is recycled or not is determined by machine learning model. However, most of the existing methods require a large amount of fresh FPGAs as correct data for machine learning, which poses a problem in actual application to industrial. In this paper, we propose a novel unsupervised recycled FPGA detection method. In the proposed method, multi-stage ROs in all logical blocks are designed on the FPGA, and adjacent ROs are compared to reduce the effects of manufacturing process variation and highlight the effects of aging degradation in the measured frequencies, and then apply outlier detection through direct density ratio estimation. Through experiments using 10 fresh commercial FPGAs and 2 out of them that were aged, we demonstrate the proposed method can detect these two recycled FPGAs without misclassification.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Recycled FPGA detection / Manufacturing process variation / Unsupervised outlier detection / Direct density ratio estimation
Paper # CPSY2020-60,DC2020-90
Date of Issue 2021-03-18 (CPSY, DC)

Conference Information
Committee CPSY / DC / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC
Conference Date 2021/3/25(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) ETNET2021
Chair Hidetsugu Irie(Univ. of Tokyo) / Hiroshi Takahashi(Ehime Univ.) / Yuichi Nakamura(NEC) / / Hiroshi Inoue(Kyushu Univ.)
Vice Chair Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Michihiro Koibuchi(Univ. of Tokyo) / Kota Nakajima(Nagoya Inst. of Tech.) / Tatsuhiro Tsuchiya(Nihon Univ.) / (Chiba Univ.) / (Tokyo City Univ.) / (Kochi Univ. of Tech.)
Assistant Shugo Ogawa(Hitachi) / Eiji Arima(Univ. of Tokyo)

Paper Information
Registration To Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Unsupervised Recycled FPGA Detection Using Direct Density Ratio Estimation Based on Self-referencing
Sub Title (in English)
Keyword(1) Recycled FPGA detection
Keyword(2) Manufacturing process variation
Keyword(3) Unsupervised outlier detection
Keyword(4) Direct density ratio estimation
1st Author's Name Yuya Isaka
1st Author's Affiliation Kwansei Gakuin University(KGU)
2nd Author's Name Michihiro Shintani
2nd Author's Affiliation Graduate School of Science and Technology, Nara Institute of Science and Technology(NAIST)
3rd Author's Name Foisal Ahmed
3rd Author's Affiliation Prime University(PU)
4th Author's Name Michiko Inoue
4th Author's Affiliation Graduate School of Science and Technology, Nara Institute of Science and Technology(NAIST)
Date 2021-03-26
Paper # CPSY2020-60,DC2020-90
Volume (vol) vol.120
Number (no) CPSY-435,DC-436
Page pp.pp.61-66(CPSY), pp.61-66(DC),
#Pages 6
Date of Issue 2021-03-18 (CPSY, DC)