Presentation | 2021-03-26 A Controller Augmentation method to Improving Transition Fault Coverage Kyohei Iizuka, Toshinori Hosokawa, Hiroshi Yamazaki, Masayoshi Yoshimura, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | With shrinking feature sizes, growing clock frequencies, and decreasing power supply voltage, modern VLSIs are increasingly suffering from the impact of timing related defects. Therefore, transition fault testing is necessary. However, test generation for transition faults generally identifies many untestable faults due to the circuit structures and functions of VLSIs. When a target fault is untestable, a test that would have covered its site is missing from the test set. As a result, the test set might not detect defects around this site, even if the defects are detectable. Therefore, design-for-testability to improve transition fault coverage is very important. QDT value were proposed as testability measure of transition fault testing for state assignments of controllers. This paper proposes a method to insert additional state transitions into controllers using extended QDT value to increase the number of sensitizable paths between state registers. Experimental results for the MCNC'91 benchmark circuits show that transition fault coverage for controllers was improved by applying our proposed method. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | transition faults / controller augmentation / QDT value / state transitions |
Paper # | CPSY2020-63,DC2020-93 |
Date of Issue | 2021-03-18 (CPSY, DC) |
Conference Information | |
Committee | CPSY / DC / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC |
---|---|
Conference Date | 2021/3/25(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | ETNET2021 |
Chair | Hidetsugu Irie(Univ. of Tokyo) / Hiroshi Takahashi(Ehime Univ.) / Yuichi Nakamura(NEC) / / Hiroshi Inoue(Kyushu Univ.) |
Vice Chair | Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Tatsuhiro Tsuchiya(Osaka Univ.) |
Secretary | Michihiro Koibuchi(Univ. of Tokyo) / Kota Nakajima(Nagoya Inst. of Tech.) / Tatsuhiro Tsuchiya(Nihon Univ.) / (Chiba Univ.) / (Tokyo City Univ.) / (Kochi Univ. of Tech.) |
Assistant | Shugo Ogawa(Hitachi) / Eiji Arima(Univ. of Tokyo) |
Paper Information | |
Registration To | Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Controller Augmentation method to Improving Transition Fault Coverage |
Sub Title (in English) | |
Keyword(1) | transition faults |
Keyword(2) | controller augmentation |
Keyword(3) | QDT value |
Keyword(4) | state transitions |
1st Author's Name | Kyohei Iizuka |
1st Author's Affiliation | Nihon University(Nihon Univ) |
2nd Author's Name | Toshinori Hosokawa |
2nd Author's Affiliation | Nihon University(Nihon Univ) |
3rd Author's Name | Hiroshi Yamazaki |
3rd Author's Affiliation | Nihon University(Nihon Univ) |
4th Author's Name | Masayoshi Yoshimura |
4th Author's Affiliation | Kyoto Sangyo University(Kyoto Sangyo Univ) |
Date | 2021-03-26 |
Paper # | CPSY2020-63,DC2020-93 |
Volume (vol) | vol.120 |
Number (no) | CPSY-435,DC-436 |
Page | pp.pp.79-84(CPSY), pp.79-84(DC), |
#Pages | 6 |
Date of Issue | 2021-03-18 (CPSY, DC) |