Presentation 2021-03-26
A Controller Augmentation method to Improving Transition Fault Coverage
Kyohei Iizuka, Toshinori Hosokawa, Hiroshi Yamazaki, Masayoshi Yoshimura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) With shrinking feature sizes, growing clock frequencies, and decreasing power supply voltage, modern VLSIs are increasingly suffering from the impact of timing related defects. Therefore, transition fault testing is necessary. However, test generation for transition faults generally identifies many untestable faults due to the circuit structures and functions of VLSIs. When a target fault is untestable, a test that would have covered its site is missing from the test set. As a result, the test set might not detect defects around this site, even if the defects are detectable. Therefore, design-for-testability to improve transition fault coverage is very important. QDT value were proposed as testability measure of transition fault testing for state assignments of controllers. This paper proposes a method to insert additional state transitions into controllers using extended QDT value to increase the number of sensitizable paths between state registers. Experimental results for the MCNC'91 benchmark circuits show that transition fault coverage for controllers was improved by applying our proposed method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) transition faults / controller augmentation / QDT value / state transitions
Paper # CPSY2020-63,DC2020-93
Date of Issue 2021-03-18 (CPSY, DC)

Conference Information
Committee CPSY / DC / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC
Conference Date 2021/3/25(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) ETNET2021
Chair Hidetsugu Irie(Univ. of Tokyo) / Hiroshi Takahashi(Ehime Univ.) / Yuichi Nakamura(NEC) / / Hiroshi Inoue(Kyushu Univ.)
Vice Chair Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Michihiro Koibuchi(Univ. of Tokyo) / Kota Nakajima(Nagoya Inst. of Tech.) / Tatsuhiro Tsuchiya(Nihon Univ.) / (Chiba Univ.) / (Tokyo City Univ.) / (Kochi Univ. of Tech.)
Assistant Shugo Ogawa(Hitachi) / Eiji Arima(Univ. of Tokyo)

Paper Information
Registration To Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Controller Augmentation method to Improving Transition Fault Coverage
Sub Title (in English)
Keyword(1) transition faults
Keyword(2) controller augmentation
Keyword(3) QDT value
Keyword(4) state transitions
1st Author's Name Kyohei Iizuka
1st Author's Affiliation Nihon University(Nihon Univ)
2nd Author's Name Toshinori Hosokawa
2nd Author's Affiliation Nihon University(Nihon Univ)
3rd Author's Name Hiroshi Yamazaki
3rd Author's Affiliation Nihon University(Nihon Univ)
4th Author's Name Masayoshi Yoshimura
4th Author's Affiliation Kyoto Sangyo University(Kyoto Sangyo Univ)
Date 2021-03-26
Paper # CPSY2020-63,DC2020-93
Volume (vol) vol.120
Number (no) CPSY-435,DC-436
Page pp.pp.79-84(CPSY), pp.79-84(DC),
#Pages 6
Date of Issue 2021-03-18 (CPSY, DC)