Presentation 2021-03-26
A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level
Kohei Tsuchibuchi, Toshinori Hosokawa, Koji Yamazaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) With the progress of semiconductor technology in recent years, fault analysis is important to improve the yield of VLSIs. Fault diagnosis, which narrows down suspected faults in advance, is an important step in fault analysis and is important to reduce the cost of fault analysis. To reduce the number of suspected faults, design-for-diagnosability methods such as test point insertion at gate level and layout level have been proposed. However, the design-for-diagnosability methods cause problems such as area overhead and destroy of timing optimization. In this paper, we propose a design-for-diagnosability method at register transfer level. Don't care filling problem of control signals on each state transition of controllers for fault diagnosability is formulated as a pseudo-Boolean optimization problem.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) fault diagnosis / don’t-care filling / register transfer level / pseudo Boolean optimization / design-for-diagnosability
Paper # CPSY2020-62,DC2020-92
Date of Issue 2021-03-18 (CPSY, DC)

Conference Information
Committee CPSY / DC / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC
Conference Date 2021/3/25(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) ETNET2021
Chair Hidetsugu Irie(Univ. of Tokyo) / Hiroshi Takahashi(Ehime Univ.) / Yuichi Nakamura(NEC) / / Hiroshi Inoue(Kyushu Univ.)
Vice Chair Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Tatsuhiro Tsuchiya(Osaka Univ.)
Secretary Michihiro Koibuchi(Univ. of Tokyo) / Kota Nakajima(Nagoya Inst. of Tech.) / Tatsuhiro Tsuchiya(Nihon Univ.) / (Chiba Univ.) / (Tokyo City Univ.) / (Kochi Univ. of Tech.)
Assistant Shugo Ogawa(Hitachi) / Eiji Arima(Univ. of Tokyo)

Paper Information
Registration To Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level
Sub Title (in English)
Keyword(1) fault diagnosis
Keyword(2) don’t-care filling
Keyword(3) register transfer level
Keyword(4) pseudo Boolean optimization
Keyword(5) design-for-diagnosability
1st Author's Name Kohei Tsuchibuchi
1st Author's Affiliation Nihon University(Nihon Univ)
2nd Author's Name Toshinori Hosokawa
2nd Author's Affiliation Nihon University(Nihon Univ)
3rd Author's Name Koji Yamazaki
3rd Author's Affiliation Meiji University(Meiji Univ.)
Date 2021-03-26
Paper # CPSY2020-62,DC2020-92
Volume (vol) vol.120
Number (no) CPSY-435,DC-436
Page pp.pp.73-78(CPSY), pp.73-78(DC),
#Pages 6
Date of Issue 2021-03-18 (CPSY, DC)