Presentation | 2021-03-26 A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level Kohei Tsuchibuchi, Toshinori Hosokawa, Koji Yamazaki, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | With the progress of semiconductor technology in recent years, fault analysis is important to improve the yield of VLSIs. Fault diagnosis, which narrows down suspected faults in advance, is an important step in fault analysis and is important to reduce the cost of fault analysis. To reduce the number of suspected faults, design-for-diagnosability methods such as test point insertion at gate level and layout level have been proposed. However, the design-for-diagnosability methods cause problems such as area overhead and destroy of timing optimization. In this paper, we propose a design-for-diagnosability method at register transfer level. Don't care filling problem of control signals on each state transition of controllers for fault diagnosability is formulated as a pseudo-Boolean optimization problem. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | fault diagnosis / don’t-care filling / register transfer level / pseudo Boolean optimization / design-for-diagnosability |
Paper # | CPSY2020-62,DC2020-92 |
Date of Issue | 2021-03-18 (CPSY, DC) |
Conference Information | |
Committee | CPSY / DC / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC |
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Conference Date | 2021/3/25(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | ETNET2021 |
Chair | Hidetsugu Irie(Univ. of Tokyo) / Hiroshi Takahashi(Ehime Univ.) / Yuichi Nakamura(NEC) / / Hiroshi Inoue(Kyushu Univ.) |
Vice Chair | Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Tatsuhiro Tsuchiya(Osaka Univ.) |
Secretary | Michihiro Koibuchi(Univ. of Tokyo) / Kota Nakajima(Nagoya Inst. of Tech.) / Tatsuhiro Tsuchiya(Nihon Univ.) / (Chiba Univ.) / (Tokyo City Univ.) / (Kochi Univ. of Tech.) |
Assistant | Shugo Ogawa(Hitachi) / Eiji Arima(Univ. of Tokyo) |
Paper Information | |
Registration To | Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level |
Sub Title (in English) | |
Keyword(1) | fault diagnosis |
Keyword(2) | don’t-care filling |
Keyword(3) | register transfer level |
Keyword(4) | pseudo Boolean optimization |
Keyword(5) | design-for-diagnosability |
1st Author's Name | Kohei Tsuchibuchi |
1st Author's Affiliation | Nihon University(Nihon Univ) |
2nd Author's Name | Toshinori Hosokawa |
2nd Author's Affiliation | Nihon University(Nihon Univ) |
3rd Author's Name | Koji Yamazaki |
3rd Author's Affiliation | Meiji University(Meiji Univ.) |
Date | 2021-03-26 |
Paper # | CPSY2020-62,DC2020-92 |
Volume (vol) | vol.120 |
Number (no) | CPSY-435,DC-436 |
Page | pp.pp.73-78(CPSY), pp.73-78(DC), |
#Pages | 6 |
Date of Issue | 2021-03-18 (CPSY, DC) |