| Presentation | 2021-03-04 Fundamental Study on Evaluation of EM Information Leakage from Smart Speakers with Different Installation Environments and Its Countermeasures Shogo Fukushima, Daisuke Fujimoto, Yuichi Hayashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Conventional studies on EM information leakage have mainly focused on only individual information devices. On the other hand, the EM radiation emitted from a device is affected by the EM environment inside and outside the device, and the installation environment of the device may affect the EM wave leakage. In this paper, we focus on the smart speaker, which is expected to be installed in a different environment for each user and may handle personal information and investigate the influence of the device's installation environment on the EM information leakage. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EM Information Leakage / Smart Speaker / Installation Environment |
| Paper # | VLD2020-91,HWS2020-66 |
| Date of Issue | 2021-02-24 (VLD, HWS) |
| Conference Information | |
| Committee | HWS / VLD |
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| Conference Date | 2021/3/3(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Technology for System-on-Silicon, Hardware Security, etc. |
| Chair | Makoto Ikeda(Univ. of Tokyo) / Daisuke Fukuda(Fujitsu Labs.) |
| Vice Chair | Yasuhisa Shimazaki(Renesas Electronics) / Makoto Nagata(Kobe Univ.) / Kazutoshi Kobayashi(Kyoto Inst. of Tech.) |
| Secretary | Yasuhisa Shimazaki(Kyushu Univ.) / Makoto Nagata(NTT) / Kazutoshi Kobayashi(Hitachi) |
| Assistant | / Takuma Nishimoto(Hitachi) |
| Paper Information | |
| Registration To | Technical Committee on Hardware Security / Technical Committee on VLSI Design Technologies |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fundamental Study on Evaluation of EM Information Leakage from Smart Speakers with Different Installation Environments and Its Countermeasures |
| Sub Title (in English) | |
| Keyword(1) | EM Information Leakage |
| Keyword(2) | Smart Speaker |
| Keyword(3) | Installation Environment |
| 1st Author's Name | Shogo Fukushima |
| 1st Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 2nd Author's Name | Daisuke Fujimoto |
| 2nd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 3rd Author's Name | Yuichi Hayashi |
| 3rd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| Date | 2021-03-04 |
| Paper # | VLD2020-91,HWS2020-66 |
| Volume (vol) | vol.120 |
| Number (no) | VLD-400,HWS-401 |
| Page | pp.pp.130-135(VLD), pp.130-135(HWS), |
| #Pages | 6 |
| Date of Issue | 2021-02-24 (VLD, HWS) |