| Presentation | 2021-03-08 Continuous open and close test of contact resistance of electromagnetic contactor Yoshihiro Sudo, Kohei Chiba, Koichiro Sawa, Kiyoshi Yoshida, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this study, the contact resistance when a small current was applied at DC5V, was automatically measured. In the experiment, the effect of the current value on the contact resistance was investigated. The current was set to 3-100mA. The continuous opening / closing test was performed up to 100,000 times. The measurement error of the assumed system was within ± 5%. In the experiment, two single contacts for the main circuit and two twin contacts for the auxiliary contacts were measured at the same time. The fluctuation of the contact resistance of the twin contacts was small and stable. On the other hand, the contact resistance of the single contact was significantly unstable at 10mA or less. At 50mA and above, the resistance value was small and stable. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LabVIEW / Electrical Contact / Electromagnetic Contactor / Single Contact / Twin Contact / Contact Resistance |
| Paper # | EMD2020-32 |
| Date of Issue | 2021-03-01 (EMD) |
| Conference Information | |
| Committee | EMD |
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| Conference Date | 2021/3/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Short NOTE |
| Chair | Yoshiki Kayano(Univ. of Electro-Comm.) |
| Vice Chair | |
| Secretary | (Nippon Inst. of Tech.) |
| Assistant | Yuichi Hayashi(ＮＡＩＳＴ) / Kazuaki Miyanaga(Fujitsu Component) |
| Paper Information | |
| Registration To | Technical Committee on Electromechanical Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Continuous open and close test of contact resistance of electromagnetic contactor |
| Sub Title (in English) | |
| Keyword(1) | LabVIEW |
| Keyword(2) | Electrical Contact |
| Keyword(3) | Electromagnetic Contactor |
| Keyword(4) | Single Contact |
| Keyword(5) | Twin Contact |
| Keyword(6) | Contact Resistance |
| 1st Author's Name | Yoshihiro Sudo |
| 1st Author's Affiliation | Nippon Institute of Technology(NIT) |
| 2nd Author's Name | Kohei Chiba |
| 2nd Author's Affiliation | Nippon Institute of Technology(NIT) |
| 3rd Author's Name | Koichiro Sawa |
| 3rd Author's Affiliation | Nippon Institute of Technology(NIT) |
| 4th Author's Name | Kiyoshi Yoshida |
| 4th Author's Affiliation | Nippon Institute of Technology(NIT) |
| Date | 2021-03-08 |
| Paper # | EMD2020-32 |
| Volume (vol) | vol.120 |
| Number (no) | EMD-425 |
| Page | pp.pp.18-22(EMD), |
| #Pages | 5 |
| Date of Issue | 2021-03-01 (EMD) |