Presentation 2021-03-08
Continuous open and close test of contact resistance of electromagnetic contactor
Yoshihiro Sudo, Kohei Chiba, Koichiro Sawa, Kiyoshi Yoshida,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In this study, the contact resistance when a small current was applied at DC5V, was automatically measured. In the experiment, the effect of the current value on the contact resistance was investigated. The current was set to 3-100mA. The continuous opening / closing test was performed up to 100,000 times. The measurement error of the assumed system was within ± 5%. In the experiment, two single contacts for the main circuit and two twin contacts for the auxiliary contacts were measured at the same time. The fluctuation of the contact resistance of the twin contacts was small and stable. On the other hand, the contact resistance of the single contact was significantly unstable at 10mA or less. At 50mA and above, the resistance value was small and stable.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) LabVIEW / Electrical Contact / Electromagnetic Contactor / Single Contact / Twin Contact / Contact Resistance
Paper # EMD2020-32
Date of Issue 2021-03-01 (EMD)

Conference Information
Committee EMD
Conference Date 2021/3/8(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Short NOTE
Chair Yoshiki Kayano(Univ. of Electro-Comm.)
Vice Chair
Secretary (Nippon Inst. of Tech.)
Assistant Yuichi Hayashi(NAIST) / Kazuaki Miyanaga(Fujitsu Component)

Paper Information
Registration To Technical Committee on Electromechanical Devices
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Continuous open and close test of contact resistance of electromagnetic contactor
Sub Title (in English)
Keyword(1) LabVIEW
Keyword(2) Electrical Contact
Keyword(3) Electromagnetic Contactor
Keyword(4) Single Contact
Keyword(5) Twin Contact
Keyword(6) Contact Resistance
1st Author's Name Yoshihiro Sudo
1st Author's Affiliation Nippon Institute of Technology(NIT)
2nd Author's Name Kohei Chiba
2nd Author's Affiliation Nippon Institute of Technology(NIT)
3rd Author's Name Koichiro Sawa
3rd Author's Affiliation Nippon Institute of Technology(NIT)
4th Author's Name Kiyoshi Yoshida
4th Author's Affiliation Nippon Institute of Technology(NIT)
Date 2021-03-08
Paper # EMD2020-32
Volume (vol) vol.120
Number (no) EMD-425
Page pp.pp.18-22(EMD),
#Pages 5
Date of Issue 2021-03-01 (EMD)