Presentation 2021-03-05
A Study of noise source identification method based on near-field measurement of switching power supplies
Hiroyasu Sano, Satoshi Suzuki, Yasuaki Kaneda, Hidekatsu Sasaki, Kenta Umebayashi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Fast switching increases the radiated noise, which is a problem that exceeds the regulation value of radiated emission test. In particular, when multiple switching power supplies are mixed, it has been difficult to identify the source of the noise because the noise overlaps in the same frequency band. In this study, we propose a method to estimate the far-field measurement waveform of each switching power supply module by identifying the noise source based on the periodicity of the pulses in the near field. In this paper, we propose a method to estimate the far-field measurement waveform of each switching power supply.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) EMI / source identification / far field / near field
Paper # EMCJ2020-78
Date of Issue 2021-02-26 (EMCJ)

Conference Information
Committee EMCJ / MICT
Conference Date 2021/3/5(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Kensei Oh(Nagoya Inst. of Tech.) / Eisuke Hanada(Saga Univ.)
Vice Chair Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Hirokazu Tanaka(Hiroshima City Univ.) / Daisuke Anzai(Nagoya Inst. of Tech.)
Secretary Atsuhiro Nishikata(Denso) / Hirokazu Tanaka(NAIST) / Daisuke Anzai(Kobe Univ.)
Assistant Nami Sasaki(Seiwa Electric MFG) / Hiroyoshi Shida(Tokin EMC Engineering) / Sho Muroga(Akita Univ.) / Keita Saku(Kyushu Univ.) / Kai Ishida(KISTEC) / Kento Takabayashi(Okayama Pref. Univ.)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility / Technical Committee on Healthcare and Medical Information Communication Technology
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study of noise source identification method based on near-field measurement of switching power supplies
Sub Title (in English)
Keyword(1) EMI
Keyword(2) source identification
Keyword(3) far field
Keyword(4) near field
1st Author's Name Hiroyasu Sano
1st Author's Affiliation Tokyo Metropolitan Industrial Technology Research Institute(TIRI)
2nd Author's Name Satoshi Suzuki
2nd Author's Affiliation Tokyo Metropolitan Industrial Technology Research Institute(TIRI)
3rd Author's Name Yasuaki Kaneda
3rd Author's Affiliation Tokyo Metropolitan Industrial Technology Research Institute(TIRI)
4th Author's Name Hidekatsu Sasaki
4th Author's Affiliation Tokyo Metropolitan Industrial Technology Research Institute(TIRI)
5th Author's Name Kenta Umebayashi
5th Author's Affiliation Tokyo University of Agriculture and Technology(TAT)
Date 2021-03-05
Paper # EMCJ2020-78
Volume (vol) vol.120
Number (no) EMCJ-420
Page pp.pp.30-34(EMCJ),
#Pages 5
Date of Issue 2021-02-26 (EMCJ)