Presentation | 2021-03-05 A Study of noise source identification method based on near-field measurement of switching power supplies Hiroyasu Sano, Satoshi Suzuki, Yasuaki Kaneda, Hidekatsu Sasaki, Kenta Umebayashi, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Fast switching increases the radiated noise, which is a problem that exceeds the regulation value of radiated emission test. In particular, when multiple switching power supplies are mixed, it has been difficult to identify the source of the noise because the noise overlaps in the same frequency band. In this study, we propose a method to estimate the far-field measurement waveform of each switching power supply module by identifying the noise source based on the periodicity of the pulses in the near field. In this paper, we propose a method to estimate the far-field measurement waveform of each switching power supply. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | EMI / source identification / far field / near field |
Paper # | EMCJ2020-78 |
Date of Issue | 2021-02-26 (EMCJ) |
Conference Information | |
Committee | EMCJ / MICT |
---|---|
Conference Date | 2021/3/5(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Kensei Oh(Nagoya Inst. of Tech.) / Eisuke Hanada(Saga Univ.) |
Vice Chair | Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Hirokazu Tanaka(Hiroshima City Univ.) / Daisuke Anzai(Nagoya Inst. of Tech.) |
Secretary | Atsuhiro Nishikata(Denso) / Hirokazu Tanaka(NAIST) / Daisuke Anzai(Kobe Univ.) |
Assistant | Nami Sasaki(Seiwa Electric MFG) / Hiroyoshi Shida(Tokin EMC Engineering) / Sho Muroga(Akita Univ.) / Keita Saku(Kyushu Univ.) / Kai Ishida(KISTEC) / Kento Takabayashi(Okayama Pref. Univ.) |
Paper Information | |
Registration To | Technical Committee on Electromagnetic Compatibility / Technical Committee on Healthcare and Medical Information Communication Technology |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study of noise source identification method based on near-field measurement of switching power supplies |
Sub Title (in English) | |
Keyword(1) | EMI |
Keyword(2) | source identification |
Keyword(3) | far field |
Keyword(4) | near field |
1st Author's Name | Hiroyasu Sano |
1st Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute(TIRI) |
2nd Author's Name | Satoshi Suzuki |
2nd Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute(TIRI) |
3rd Author's Name | Yasuaki Kaneda |
3rd Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute(TIRI) |
4th Author's Name | Hidekatsu Sasaki |
4th Author's Affiliation | Tokyo Metropolitan Industrial Technology Research Institute(TIRI) |
5th Author's Name | Kenta Umebayashi |
5th Author's Affiliation | Tokyo University of Agriculture and Technology(TAT) |
Date | 2021-03-05 |
Paper # | EMCJ2020-78 |
Volume (vol) | vol.120 |
Number (no) | EMCJ-420 |
Page | pp.pp.30-34(EMCJ), |
#Pages | 5 |
Date of Issue | 2021-02-26 (EMCJ) |