| Presentation | 2021-03-18 [Encouragement Talk] An Automation Technology of Testing Environment Configuration for ICT System Products by Search-based System Design Generation Scheme Kazuki Tanabe, Takayuki Kuroda, Kozo Satoda, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we propose an automation technology to generate comprehensive testing environments for performance evaluation of ICT system component products e.g. applications and NW equipments. In general testing phase of product development, comprehensive performance tests have to be conducted on various testing environments for verifying products’ functional and non-functional requirements. Conventional performance tests require manual requirement definition, designing and deployment for each variation of testing environment (testing pattern), which puts heavy burden for engineers. Our proposed architecture accepts product data as an input, which consists of two types of parameters: parameters to determine testing pattern (testing axis) and performance parameters to be measured (testing criterion). Our architecture generates abstract testing environments (testing requirements) by referring to templates of testing environments (testing template). Finally, our search-based system design generation scheme automatically generates and deploys the testing environments, by refining abstract parts of testing requirements. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ICT system design generation / product evaluation |
| Paper # | ICM2020-60 |
| Date of Issue | 2021-03-11 (ICM) |
| Conference Information | |
| Committee | ICM |
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| Conference Date | 2021/3/18(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Kazuhiko Kinoshita(Tokushima Univ.) |
| Vice Chair | Yoichi Sato(OSL) / Haruo Ooishi(NTT) |
| Secretary | Yoichi Sato(NTT) / Haruo Ooishi(Bosco) |
| Assistant | Tetsuya Uchiumi(Fujitsu Lab.) |
| Paper Information | |
| Registration To | Technical Committee on Information and Communication Management |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Encouragement Talk] An Automation Technology of Testing Environment Configuration for ICT System Products by Search-based System Design Generation Scheme |
| Sub Title (in English) | |
| Keyword(1) | ICT system design generation |
| Keyword(2) | product evaluation |
| 1st Author's Name | Kazuki Tanabe |
| 1st Author's Affiliation | NEC Corporation(NEC) |
| 2nd Author's Name | Takayuki Kuroda |
| 2nd Author's Affiliation | NEC Corporation(NEC) |
| 3rd Author's Name | Kozo Satoda |
| 3rd Author's Affiliation | NEC Corporation(NEC) |
| Date | 2021-03-18 |
| Paper # | ICM2020-60 |
| Volume (vol) | vol.120 |
| Number (no) | ICM-433 |
| Page | pp.pp.7-12(ICM), |
| #Pages | 6 |
| Date of Issue | 2021-03-11 (ICM) |