| Presentation | 2021-01-22 TLP circuit for immunity evaluation emulating electromagnetic disturbance in automobile Kyousuke Tanaka, Dai-ichiro Koike, Tohlu Matsushima, Yuki Fukumoto, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The purpose of this research is to make a disturbance generator for evaluation of immunity characteristic of electronic devices to electromagnetic noise expected in automobiles. In this circuit, a pulse is passed through a waveform- forming filter to generate the disturbance. In this report, the TLP circuit was developed that generates one shot pulse using TLP method and carries it to the filter. The requirement specification of this TLP circuit is the rise time of the pulse of 10 ns or less. Since the rise time of the pulse depends on the switch in the circuit, a switch with a short transition time is required. Therefore, the TLP circuit was developed using GaN switch with the rise time of 9 ns. The rise time of output pulse of the TLP circuit was measured to be 7.7 ns which satisfy the specification. In addition, in order to verify to the performance of the TLP circuit, TLP pulse was applied to ESD protection device. The I-V characteristics obtained from the measurements were roughly in agreement with the characteristics described in the device specification sheet. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | TLP(Transmission Line Pulse) / TDR-TLP / immunity / rise time / GaN switch |
| Paper # | EMCJ2020-65 |
| Date of Issue | 2021-01-15 (EMCJ) |
| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2021/1/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Kensei Oh(Nagoya Inst. of Tech.) |
| Vice Chair | Atsuhiro Nishikata(Tokyo Inst. of Tech.) |
| Secretary | Atsuhiro Nishikata(Denso) |
| Assistant | Nami Sasaki(Seiwa Electric MFG) / Hiroyoshi Shida(Tokin EMC Engineering) / Sho Muroga(Akita Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | TLP circuit for immunity evaluation emulating electromagnetic disturbance in automobile |
| Sub Title (in English) | |
| Keyword(1) | TLP(Transmission Line Pulse) |
| Keyword(2) | TDR-TLP |
| Keyword(3) | immunity |
| Keyword(4) | rise time |
| Keyword(5) | GaN switch |
| 1st Author's Name | Kyousuke Tanaka |
| 1st Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 2nd Author's Name | Dai-ichiro Koike |
| 2nd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 3rd Author's Name | Tohlu Matsushima |
| 3rd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 4th Author's Name | Yuki Fukumoto |
| 4th Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| Date | 2021-01-22 |
| Paper # | EMCJ2020-65 |
| Volume (vol) | vol.120 |
| Number (no) | EMCJ-333 |
| Page | pp.pp.7-12(EMCJ), |
| #Pages | 6 |
| Date of Issue | 2021-01-15 (EMCJ) |