Presentation 2021-01-25
Comparison of ICA Algorithms in the Compressed Sensing EEG Measurement Framework Using OD-ICA
Wataru Okumura, Daisuke Kanemoto, Osamu Maida, Tetsuya Hirose,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Compressed sensing gives reduction of power consumption for electroencephalogram (EEG) measurement system. However, ocular artifacts(OA) for compressed EEG signals cause a serious problem in reconstruction of compressed EEG signal with high accuracy. Therefore, an independent component analysis method using outlier detection (OD-ICA) has been proposed as a method for removing OA. The purpose of this study is to compare and examine three types of independent component analysis algorithms used for OD-ICA and select an algorithm suitable for this framework.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Electroencephalography / Compressed Sensing / Independent Component Analysis / Outlier Detection / Artifact
Paper # VLD2020-52,CPSY2020-35,RECONF2020-71
Date of Issue 2021-01-18 (VLD, CPSY, RECONF)

Conference Information
Committee CPSY / RECONF / VLD / IPSJ-ARC / IPSJ-SLDM
Conference Date 2021/1/25(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) FPGA Applications, etc.
Chair Hidetsugu Irie(Univ. of Tokyo) / Yuichiro Shibata(Nagasaki Univ.) / Daisuke Fukuda(Fujitsu Labs.) / Hiroshi Inoue(Kyushu Univ.) / Yuichi Nakamura(NEC)
Vice Chair Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Kentaro Sano(RIKEN) / Yoshiki Yamaguchi(Tsukuba Univ.) / Kazutoshi Kobayashi(Kyoto Inst. of Tech.)
Secretary Michihiro Koibuchi(Hokkaido Univ.) / Kota Nakajima(Nagoya Inst. of Tech.) / Kentaro Sano(e-trees.Japan) / Yoshiki Yamaguchi(NEC) / Kazutoshi Kobayashi(Hitachi) / (Osaka Univ.) / (Fujitsu lab.)
Assistant Shugo Ogawa(Hitachi) / Eiji Arima(Univ. of Tokyo) / Hiroki Nakahara(Tokyo Inst. of Tech.) / Yukitaka Takemura(INTEL) / Takuma Nishimoto(Hitachi)

Paper Information
Registration To Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on VLSI Design Technologies / Special Interest Group on System Architecture / Special Interest Group on System and LSI Design Methodology
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Comparison of ICA Algorithms in the Compressed Sensing EEG Measurement Framework Using OD-ICA
Sub Title (in English)
Keyword(1) Electroencephalography
Keyword(2) Compressed Sensing
Keyword(3) Independent Component Analysis
Keyword(4) Outlier Detection
Keyword(5) Artifact
1st Author's Name Wataru Okumura
1st Author's Affiliation Osaka University(Osaka Univ)
2nd Author's Name Daisuke Kanemoto
2nd Author's Affiliation Osaka University(Osaka Univ)
3rd Author's Name Osamu Maida
3rd Author's Affiliation Osaka University(Osaka Univ)
4th Author's Name Tetsuya Hirose
4th Author's Affiliation Osaka University(Osaka Univ)
Date 2021-01-25
Paper # VLD2020-52,CPSY2020-35,RECONF2020-71
Volume (vol) vol.120
Number (no) VLD-337,CPSY-338,RECONF-339
Page pp.pp.75-79(VLD), pp.75-79(CPSY), pp.75-79(RECONF),
#Pages 5
Date of Issue 2021-01-18 (VLD, CPSY, RECONF)