Presentation | 2021-01-25 Comparison of ICA Algorithms in the Compressed Sensing EEG Measurement Framework Using OD-ICA Wataru Okumura, Daisuke Kanemoto, Osamu Maida, Tetsuya Hirose, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Compressed sensing gives reduction of power consumption for electroencephalogram (EEG) measurement system. However, ocular artifacts(OA) for compressed EEG signals cause a serious problem in reconstruction of compressed EEG signal with high accuracy. Therefore, an independent component analysis method using outlier detection (OD-ICA) has been proposed as a method for removing OA. The purpose of this study is to compare and examine three types of independent component analysis algorithms used for OD-ICA and select an algorithm suitable for this framework. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Electroencephalography / Compressed Sensing / Independent Component Analysis / Outlier Detection / Artifact |
Paper # | VLD2020-52,CPSY2020-35,RECONF2020-71 |
Date of Issue | 2021-01-18 (VLD, CPSY, RECONF) |
Conference Information | |
Committee | CPSY / RECONF / VLD / IPSJ-ARC / IPSJ-SLDM |
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Conference Date | 2021/1/25(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | FPGA Applications, etc. |
Chair | Hidetsugu Irie(Univ. of Tokyo) / Yuichiro Shibata(Nagasaki Univ.) / Daisuke Fukuda(Fujitsu Labs.) / Hiroshi Inoue(Kyushu Univ.) / Yuichi Nakamura(NEC) |
Vice Chair | Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Kentaro Sano(RIKEN) / Yoshiki Yamaguchi(Tsukuba Univ.) / Kazutoshi Kobayashi(Kyoto Inst. of Tech.) |
Secretary | Michihiro Koibuchi(Hokkaido Univ.) / Kota Nakajima(Nagoya Inst. of Tech.) / Kentaro Sano(e-trees.Japan) / Yoshiki Yamaguchi(NEC) / Kazutoshi Kobayashi(Hitachi) / (Osaka Univ.) / (Fujitsu lab.) |
Assistant | Shugo Ogawa(Hitachi) / Eiji Arima(Univ. of Tokyo) / Hiroki Nakahara(Tokyo Inst. of Tech.) / Yukitaka Takemura(INTEL) / Takuma Nishimoto(Hitachi) |
Paper Information | |
Registration To | Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on VLSI Design Technologies / Special Interest Group on System Architecture / Special Interest Group on System and LSI Design Methodology |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Comparison of ICA Algorithms in the Compressed Sensing EEG Measurement Framework Using OD-ICA |
Sub Title (in English) | |
Keyword(1) | Electroencephalography |
Keyword(2) | Compressed Sensing |
Keyword(3) | Independent Component Analysis |
Keyword(4) | Outlier Detection |
Keyword(5) | Artifact |
1st Author's Name | Wataru Okumura |
1st Author's Affiliation | Osaka University(Osaka Univ) |
2nd Author's Name | Daisuke Kanemoto |
2nd Author's Affiliation | Osaka University(Osaka Univ) |
3rd Author's Name | Osamu Maida |
3rd Author's Affiliation | Osaka University(Osaka Univ) |
4th Author's Name | Tetsuya Hirose |
4th Author's Affiliation | Osaka University(Osaka Univ) |
Date | 2021-01-25 |
Paper # | VLD2020-52,CPSY2020-35,RECONF2020-71 |
Volume (vol) | vol.120 |
Number (no) | VLD-337,CPSY-338,RECONF-339 |
Page | pp.pp.75-79(VLD), pp.75-79(CPSY), pp.75-79(RECONF), |
#Pages | 5 |
Date of Issue | 2021-01-18 (VLD, CPSY, RECONF) |