Presentation | 2021-01-21 Extraction Method of Time Drift Characteristics of Digital Equipment Using Incubator Asu Kobayashi, Masumi Mitobe, Kiyonari Katsura, Naoto Hoshikawa, Atsushi Shiraki, Tomoyoshi Ito, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Nowadays, as the number of IoT computers increases, the risks of malicious replacement and spoofing (and so on) have been increasing and appropriate methods for digital equipment identification are needed. We propose a method for device identification using the specific correlation between time drift and CPU core temperature. However, conventional methods require a long time to measure the time drift characteristics because the CPU core temperature depends on the change of the environmental temperature. To solve this problem, we attempted to measure the characteristics using a incubator. The experimental results showed that the proposed method can measure the characteristics in the range of 3 $^circ$C to 55 $^circ$C of the CPU core temperature in a day, while the conventional method took about two months to change by about 10 $^circ$C. Furthermore, it was found that the characteristics show a cubic curve by measuring over a wide range of temperature. It was similar to the temperature characteristics of the frequency of AT-cut crystal used in clock generators, and it indicates the possibility that the time drift characteristics arise from the characteristics of the clock generator. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | IoT / system time / time drift / CPU / identification / incubator |
Paper # | NS2020-113 |
Date of Issue | 2021-01-14 (NS) |
Conference Information | |
Committee | NS |
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Conference Date | 2021/1/21(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Network software (Software architecture, Middleware), Network application, SOA/SDP, NGN/IMS/API, Distributed control/Dynamic routing, Grid, NFV, IoT, Network/System reliability, Network/System evaluation, etc. |
Chair | Akihiro Nakao(Univ. of Tokyo) |
Vice Chair | Tetsuya Oishi(NTT) |
Secretary | Tetsuya Oishi(NTT) |
Assistant | Shinya Kawano(NTT) |
Paper Information | |
Registration To | Technical Committee on Network Systems |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Extraction Method of Time Drift Characteristics of Digital Equipment Using Incubator |
Sub Title (in English) | |
Keyword(1) | IoT |
Keyword(2) | system time |
Keyword(3) | time drift |
Keyword(4) | CPU |
Keyword(5) | identification |
Keyword(6) | incubator |
1st Author's Name | Asu Kobayashi |
1st Author's Affiliation | National Institute of Technology (KOSEN), Oyama College(Oyama College) |
2nd Author's Name | Masumi Mitobe |
2nd Author's Affiliation | National Institute of Technology (KOSEN), Oyama College(Oyama College) |
3rd Author's Name | Kiyonari Katsura |
3rd Author's Affiliation | National Institute of Technology (KOSEN), Oyama College(Oyama College) |
4th Author's Name | Naoto Hoshikawa |
4th Author's Affiliation | National Institute of Technology (KOSEN), Oyama College(Oyama College) |
5th Author's Name | Atsushi Shiraki |
5th Author's Affiliation | Chiba University(Chiba Univ.) |
6th Author's Name | Tomoyoshi Ito |
6th Author's Affiliation | Chiba University(Chiba Univ.) |
Date | 2021-01-21 |
Paper # | NS2020-113 |
Volume (vol) | vol.120 |
Number (no) | NS-327 |
Page | pp.pp.20-23(NS), |
#Pages | 4 |
Date of Issue | 2021-01-14 (NS) |