Presentation 2021-01-21
Extraction Method of Time Drift Characteristics of Digital Equipment Using Incubator
Asu Kobayashi, Masumi Mitobe, Kiyonari Katsura, Naoto Hoshikawa, Atsushi Shiraki, Tomoyoshi Ito,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Nowadays, as the number of IoT computers increases, the risks of malicious replacement and spoofing (and so on) have been increasing and appropriate methods for digital equipment identification are needed. We propose a method for device identification using the specific correlation between time drift and CPU core temperature. However, conventional methods require a long time to measure the time drift characteristics because the CPU core temperature depends on the change of the environmental temperature. To solve this problem, we attempted to measure the characteristics using a incubator. The experimental results showed that the proposed method can measure the characteristics in the range of 3 $^circ$C to 55 $^circ$C of the CPU core temperature in a day, while the conventional method took about two months to change by about 10 $^circ$C. Furthermore, it was found that the characteristics show a cubic curve by measuring over a wide range of temperature. It was similar to the temperature characteristics of the frequency of AT-cut crystal used in clock generators, and it indicates the possibility that the time drift characteristics arise from the characteristics of the clock generator.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) IoT / system time / time drift / CPU / identification / incubator
Paper # NS2020-113
Date of Issue 2021-01-14 (NS)

Conference Information
Committee NS
Conference Date 2021/1/21(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Network software (Software architecture, Middleware), Network application, SOA/SDP, NGN/IMS/API, Distributed control/Dynamic routing, Grid, NFV, IoT, Network/System reliability, Network/System evaluation, etc.
Chair Akihiro Nakao(Univ. of Tokyo)
Vice Chair Tetsuya Oishi(NTT)
Secretary Tetsuya Oishi(NTT)
Assistant Shinya Kawano(NTT)

Paper Information
Registration To Technical Committee on Network Systems
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Extraction Method of Time Drift Characteristics of Digital Equipment Using Incubator
Sub Title (in English)
Keyword(1) IoT
Keyword(2) system time
Keyword(3) time drift
Keyword(4) CPU
Keyword(5) identification
Keyword(6) incubator
1st Author's Name Asu Kobayashi
1st Author's Affiliation National Institute of Technology (KOSEN), Oyama College(Oyama College)
2nd Author's Name Masumi Mitobe
2nd Author's Affiliation National Institute of Technology (KOSEN), Oyama College(Oyama College)
3rd Author's Name Kiyonari Katsura
3rd Author's Affiliation National Institute of Technology (KOSEN), Oyama College(Oyama College)
4th Author's Name Naoto Hoshikawa
4th Author's Affiliation National Institute of Technology (KOSEN), Oyama College(Oyama College)
5th Author's Name Atsushi Shiraki
5th Author's Affiliation Chiba University(Chiba Univ.)
6th Author's Name Tomoyoshi Ito
6th Author's Affiliation Chiba University(Chiba Univ.)
Date 2021-01-21
Paper # NS2020-113
Volume (vol) vol.120
Number (no) NS-327
Page pp.pp.20-23(NS),
#Pages 4
Date of Issue 2021-01-14 (NS)