| Presentation | 2020-12-04 Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto, Taiki Kitazawa, Takashi Kasuga, Yuichi Hayashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As the operating frequency of information devices increases, the noise generated by the device is also becoming broadband. Propagation of the broadband noise to connectors used for the interconnection of information devices causes electromagnetic (EM) radiation and degrades the immunity of the device, which affects the EM environment. Previous reports have evaluated the degradation of the EM environment by focusing on the part where impedance mismatched caused by aging and contact failure at the contact boundary of the connector. These reports show that the propagation of high-frequency signals to the contact boundary of the mismatched connector causes an increase in unintentional EM radiation and degrades the device immunity. On the other hand, in this paper, we evaluate the possibility of the EM environment degradation caused by the noise propagation including off-standard high-frequency to connectors that have a good contact condition, by observing impacts of the parasitic components to the electrical performance of the connector. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Time domain reflectometryTDRhigh-frequency noiseparasitic components |
| Paper # | EMD2020-24 |
| Date of Issue | 2020-11-27 (EMD) |
| Conference Information | |
| Committee | EMD |
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| Conference Date | 2020/12/4(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | International Session IS-EMD2020 |
| Chair | Yoshiki Kayano(Univ. of Electro-Comm.) |
| Vice Chair | |
| Secretary | (Nippon Inst. of Tech.) |
| Assistant | Yuichi Hayashi(ＮＡＩＳＴ) / Kazuaki Miyanaga(Fujitsu Component) |
| Paper Information | |
| Registration To | Technical Committee on Electromechanical Devices |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation |
| Sub Title (in English) | |
| Keyword(1) | Time domain reflectometryTDRhigh-frequency noiseparasitic components |
| 1st Author's Name | Hiroyuki Ueda |
| 1st Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 2nd Author's Name | Shugo Kaji |
| 2nd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 3rd Author's Name | Youngwoo Kim |
| 3rd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 4th Author's Name | Daisuke Fujimoto |
| 4th Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 5th Author's Name | Taiki Kitazawa |
| 5th Author's Affiliation | National Institute of Technology, Nagano College(NIT,Nagano College)) |
| 6th Author's Name | Takashi Kasuga |
| 6th Author's Affiliation | National Institute of Technology, Nagano College(NIT,Nagano College)) |
| 7th Author's Name | Yuichi Hayashi |
| 7th Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| Date | 2020-12-04 |
| Paper # | EMD2020-24 |
| Volume (vol) | vol.120 |
| Number (no) | EMD-275 |
| Page | pp.pp.34-38(EMD), |
| #Pages | 5 |
| Date of Issue | 2020-11-27 (EMD) |