Presentation 2020-11-27
Improved performance in GaN-based HEMTs with insulated gate structures
Ali Baratov, Takashi Ozawa, Shunpei Yamashita, Joel T. Asubar, Hirokuni Tokuda, Masaaki Kuzuhara,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Several groups have reported improved performance in GaN-based transistors employing metal-insulator-semiconductor (MIS) structures over their Schottky-gate (SG) device counterparts. However, to the best of authors’ knowledge, large signal characteristics of those devices are rarely discussed or compared. In this study we have fabricated (ZrO2, SiO2) MIS and SiN passivated SG HEMTs, using Al0.25Ga0.75N/GaN epitaxially grown on semi-insulating SiC substrates. S-parameters were measured and subsequent de-embedding calculations were performed to quantify parasitic components. Alongside with small signal parameters, large signal load-pull measurements were performed. Electron mobility of gateless devices was also measured and compared.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) AlGaN/GaN HEMT / MIS-HEMT / high frequency performance / s-parameters / LP measurements
Paper # ED2020-16,CPM2020-37,LQE2020-67
Date of Issue 2020-11-19 (ED, CPM, LQE)

Conference Information
Committee LQE / CPM / ED
Conference Date 2020/11/26(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hiroshi Yasaka(Tohoku Univ.) / Mayumi Takeyama(Kitami Inst. of Tech.) / Michihiko Suhara(TMU)
Vice Chair Toshitada Umezawa(NICT) / Yuichi Nakamura(Toyohashi Univ. of Tech.) / Hiroki Fujishiro(Tokyo Univ. of Science)
Secretary Toshitada Umezawa(Osaka Univ.) / Yuichi Nakamura(NTT) / Hiroki Fujishiro(Hirosaki Univ.)
Assistant Kazuue Fujita(Hamamatsu) / Nobuhiko Nishiyama(Tokyo Inst. of Tech.) / Yasuo Kimura(Tokyo Univ. of Tech.) / Tomoaki Terasako(Ehime Univ.) / Fumihiko Hirose(Yamagata Univ.) / Takuya Tsutsumi(NTT)

Paper Information
Registration To Technical Committee on Lasers and Quantum Electronics / Technical Committee on Component Parts and Materials / Technical Committee on Electron Devices
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Improved performance in GaN-based HEMTs with insulated gate structures
Sub Title (in English)
Keyword(1) AlGaN/GaN HEMT
Keyword(2) MIS-HEMT
Keyword(3) high frequency performance
Keyword(4) s-parameters
Keyword(5) LP measurements
1st Author's Name Ali Baratov
1st Author's Affiliation University of Fukui(Univ. of Fukui)
2nd Author's Name Takashi Ozawa
2nd Author's Affiliation University of Fukui(Univ. of Fukui)
3rd Author's Name Shunpei Yamashita
3rd Author's Affiliation University of Fukui(Univ. of Fukui)
4th Author's Name Joel T. Asubar
4th Author's Affiliation University of Fukui(Univ. of Fukui)
5th Author's Name Hirokuni Tokuda
5th Author's Affiliation University of Fukui(Univ. of Fukui)
6th Author's Name Masaaki Kuzuhara
6th Author's Affiliation Kwansei Gakuin University(Kwansei Gakuin Univ.)
Date 2020-11-27
Paper # ED2020-16,CPM2020-37,LQE2020-67
Volume (vol) vol.120
Number (no) ED-254,CPM-255,LQE-256
Page pp.pp.60-62(ED), pp.60-62(CPM), pp.60-62(LQE),
#Pages 3
Date of Issue 2020-11-19 (ED, CPM, LQE)