Presentation 2020-11-30
On Software Safety Integrity Assessment for E/E/PE Safety-Related Systems
Shinji Inoue, Takaji Fujiwara, Shigeru Yamada,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # R2020-24
Date of Issue 2020-11-23 (R)

Conference Information
Committee R
Conference Date 2020/11/30(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Reliability of semiconductor and electronic devices, Reliability general
Chair Akira Asato(Fujitsu)
Vice Chair Tadashi Dohi(Hiroshima Univ.)
Secretary Tadashi Dohi(Hosei Univ.)
Assistant Hiroyuki Okamura(Hiroshima Univ.) / Shinji Yokogawa(Univ. of Electro-Comm.)

Paper Information
Registration To Technical Committee on Reliability
Language ENG-JTITLE
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On Software Safety Integrity Assessment for E/E/PE Safety-Related Systems
Sub Title (in English)
Keyword(1)
1st Author's Name Shinji Inoue
1st Author's Affiliation Kansai University(Kansai Univ.)
2nd Author's Name Takaji Fujiwara
2nd Author's Affiliation SRATECH Laboratory Inc.(SRATECH Lab. Inc.)
3rd Author's Name Shigeru Yamada
3rd Author's Affiliation Tottori University(Tottori Univ.)
Date 2020-11-30
Paper # R2020-24
Volume (vol) vol.120
Number (no) R-267
Page pp.pp.7-12(R),
#Pages 6
Date of Issue 2020-11-23 (R)